{"title":"Influence of Ho, Gd, La Doping on Grain-Grain Boundary Characteristics and Minimization of Leakage Current in Nickel Ferrites","authors":"Sanchit Kumar, Chaitali Mondal, Abhigyan Dutta, Ankurava Sinha","doi":"10.1149/2162-8777/ad6503","DOIUrl":null,"url":null,"abstract":"This study explores the impact of doping with Ho, Gd, and La on sol-gel-derived nickel ferrites through a comprehensive analysis using various analytical techniques. The combination of X-ray diffraction (XRD) analysis, X-ray fluorescence (XRF) spectra analysis, impedance spectroscopy, and I-V analysis enables a detailed exploration of the structural, compositional, and electrical characteristics of the samples. Williamson-Hall plots in XRD analysis reveal crucial insights into grain and grain boundary impacts, revealing a shift in trends for doped samples indicative of tensile strain and underscores the influence of dopant ions on lattice distortion. XRF study confirms the elemental composition of the samples, validating the experimental approach. Impedance spectroscopy sheds light on conduction mechanisms and charge transfer processes, while the modulus study identifies distinct relaxation peaks corresponding to grain and grain boundary relaxation mechanisms. IV analysis demonstrates a significant reduction in leakage current with rare Earth element doping, suggesting promising applications.","PeriodicalId":11496,"journal":{"name":"ECS Journal of Solid State Science and Technology","volume":null,"pages":null},"PeriodicalIF":1.8000,"publicationDate":"2024-07-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ECS Journal of Solid State Science and Technology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1149/2162-8777/ad6503","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
This study explores the impact of doping with Ho, Gd, and La on sol-gel-derived nickel ferrites through a comprehensive analysis using various analytical techniques. The combination of X-ray diffraction (XRD) analysis, X-ray fluorescence (XRF) spectra analysis, impedance spectroscopy, and I-V analysis enables a detailed exploration of the structural, compositional, and electrical characteristics of the samples. Williamson-Hall plots in XRD analysis reveal crucial insights into grain and grain boundary impacts, revealing a shift in trends for doped samples indicative of tensile strain and underscores the influence of dopant ions on lattice distortion. XRF study confirms the elemental composition of the samples, validating the experimental approach. Impedance spectroscopy sheds light on conduction mechanisms and charge transfer processes, while the modulus study identifies distinct relaxation peaks corresponding to grain and grain boundary relaxation mechanisms. IV analysis demonstrates a significant reduction in leakage current with rare Earth element doping, suggesting promising applications.
期刊介绍:
The ECS Journal of Solid State Science and Technology (JSS) was launched in 2012, and publishes outstanding research covering fundamental and applied areas of solid state science and technology, including experimental and theoretical aspects of the chemistry and physics of materials and devices.
JSS has five topical interest areas:
carbon nanostructures and devices
dielectric science and materials
electronic materials and processing
electronic and photonic devices and systems
luminescence and display materials, devices and processing.