Combining Prior Knowledge With Transfer Learning (PKID-TL) for Fast Neural Network Enabled Uncertainty Quantification of Graphene On-Chip Interconnects
Surila Guglani;Asha Kumari Jakhar;Avirup Dasgupta;Sourajeet Roy
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引用次数: 0
Abstract
In this article, an artificial neural network (ANN)-enabled uncertainty quantification (UQ) technique is developed for graphene on-chip interconnects. In the proposed technique, primary ANNs are trained to emulate the signal integrity (SI) characteristics of multiwalled carbon nanotube (MWCNT) and multilayer graphene nanoribbon (MLGNR) interconnects. The training of the primary ANNs is accelerated by using information elicited from other ANNs, known as secondary ANNs, that have been pretrained to perform related tasks. In this article, the elicited information takes two forms: 1) the optimized values of the weights and bias terms and 2) the output features of the secondary ANNs. Algorithms to intelligently infuse these two distinct types of information using a multistep training process have been proposed to ensure the best possible speedup. Validation examples spanning both MWCNT and MLGNR interconnect networks and different technology nodes have been presented.
期刊介绍:
IEEE Transactions on Components, Packaging, and Manufacturing Technology publishes research and application articles on modeling, design, building blocks, technical infrastructure, and analysis underpinning electronic, photonic and MEMS packaging, in addition to new developments in passive components, electrical contacts and connectors, thermal management, and device reliability; as well as the manufacture of electronics parts and assemblies, with broad coverage of design, factory modeling, assembly methods, quality, product robustness, and design-for-environment.