Electroless silver plating on through-glass via (TGV) as an adhesive and conducting layer

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Microelectronics Journal Pub Date : 2024-08-17 DOI:10.1016/j.mejo.2024.106371
Yuxuan Huang , Zhihua Tao , Xudong Cai , Zhiyuan Long , Zewei Lin , Wenlei Li , Zhen Fang , Lingyue Wang , Siqi He , Xingzhou Cai , Yong Li , Jihua Zhang
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Abstract

The proposed method presents a scheme to modify the surface of the glass substrate using the piranha solution and to fabricate the conducting layer of the Through-glass Via (TGV) by the glucose-Ag electroless plating to achieve TGV metallization. The arithmetic mean deviation of the surface contours (Ra) for the substrates increases from 0.001 to 0.135. The contact angle of the substrates (unmodified and modified) is reduced to 6.4° and 12.2°, respectively. The sensitization process with SnCl2 and the activation process with silver ammonia solution are conducted using the glucose as the reducing agent to prepare the silver seed layer covered in the TGV through-vias with a high aspect ratio (9:1). The adhesion between the metal coating and the surface is measured by the 3M tape and chemical mechanical polishing (CMP). The metal coating adheres well to the surface-modified substrate without peeling off, which can satisfy the demands for the electroplating and CMP processes.

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作为粘合剂和导电层的非电解镀银通孔玻璃 (TGV)
所提出的方法提出了一种利用食人鱼溶液对玻璃基板表面进行改性的方案,并通过葡萄糖-无电解镀银法制造出玻璃通孔(TGV)的导电层,从而实现 TGV 金属化。基底表面轮廓的算术平均偏差(Ra)从 0.001 增加到 0.135。基底(未改性和改性)的接触角分别减小到 6.4° 和 12.2°。以葡萄糖为还原剂,用氯化锡进行敏化处理,再用银氨溶液进行活化处理,制备出覆盖在高纵横比(9:1)TGV 通孔上的银种子层。通过 3M 胶带和化学机械抛光(CMP)测量了金属涂层与表面之间的附着力。金属涂层与表面改性基底的附着力良好,没有脱落现象,可以满足电镀和 CMP 工艺的要求。
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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