{"title":"Joining and separating behavior of roughness interface in CF/PEEK nanocomposite","authors":"","doi":"10.1016/j.polymer.2024.127557","DOIUrl":null,"url":null,"abstract":"<div><p>The rough contact plays an important role in the adhesion of carbon fiber/polymer matrix interface and interface modeling techniques are integral to quantify the effects of roughness factors on material properties. Taking the popular CF/PEEK materials as the object, an atomic method is proposed to construct CF/PEEK rough interfaces in this paper, which adopts a sinusoidal form to change the roughness regularly. Based on molecular dynamics (MD) simulations, CF/PEEK tensile separation experiment is processed and the response of the CF/PEEK interfaces with different roughness under mechanical loading are investigated. Based on the recorded CF/PEEK atomic force-displacement behavior, innovating roughness parameters, a traction separation law for the interface region is proposed. This study found the contact area between the two phases, which can be greatly improved through rough structures, determines the interfacial adhesion strength. In addition, this study observes interesting phenomena through the capturing atomic states, such as the polymer chains at the boundary between the two phases are greatly stretched.</p></div>","PeriodicalId":405,"journal":{"name":"Polymer","volume":null,"pages":null},"PeriodicalIF":4.1000,"publicationDate":"2024-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Polymer","FirstCategoryId":"92","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0032386124008930","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"POLYMER SCIENCE","Score":null,"Total":0}
引用次数: 0
Abstract
The rough contact plays an important role in the adhesion of carbon fiber/polymer matrix interface and interface modeling techniques are integral to quantify the effects of roughness factors on material properties. Taking the popular CF/PEEK materials as the object, an atomic method is proposed to construct CF/PEEK rough interfaces in this paper, which adopts a sinusoidal form to change the roughness regularly. Based on molecular dynamics (MD) simulations, CF/PEEK tensile separation experiment is processed and the response of the CF/PEEK interfaces with different roughness under mechanical loading are investigated. Based on the recorded CF/PEEK atomic force-displacement behavior, innovating roughness parameters, a traction separation law for the interface region is proposed. This study found the contact area between the two phases, which can be greatly improved through rough structures, determines the interfacial adhesion strength. In addition, this study observes interesting phenomena through the capturing atomic states, such as the polymer chains at the boundary between the two phases are greatly stretched.
期刊介绍:
Polymer is an interdisciplinary journal dedicated to publishing innovative and significant advances in Polymer Physics, Chemistry and Technology. We welcome submissions on polymer hybrids, nanocomposites, characterisation and self-assembly. Polymer also publishes work on the technological application of polymers in energy and optoelectronics.
The main scope is covered but not limited to the following core areas:
Polymer Materials
Nanocomposites and hybrid nanomaterials
Polymer blends, films, fibres, networks and porous materials
Physical Characterization
Characterisation, modelling and simulation* of molecular and materials properties in bulk, solution, and thin films
Polymer Engineering
Advanced multiscale processing methods
Polymer Synthesis, Modification and Self-assembly
Including designer polymer architectures, mechanisms and kinetics, and supramolecular polymerization
Technological Applications
Polymers for energy generation and storage
Polymer membranes for separation technology
Polymers for opto- and microelectronics.