M Defer, S Dasgupta, A J Shahani, X Xiao, D Juul Jensen, Y Zhang
{"title":"Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography","authors":"M Defer, S Dasgupta, A J Shahani, X Xiao, D Juul Jensen, Y Zhang","doi":"10.1088/1757-899x/1310/1/012027","DOIUrl":null,"url":null,"abstract":"In AlSi10Mg samples manufactured by Laser Powder Bed Fusion, distinguishing the Si eutectic network/Si particles from the Al matrix by X-ray imaging is challenging due to the low absorption contrast between the Al and Si. This work investigates the possibility of overcoming this obstacle in synchrotron transmission X-ray microscopy. Effects of both different defocusing conditions and X-ray beam energies are evaluated and optimal conditions are identified for imaging a sample annealed post-print for 2h at 520°C. It is shown that both large particles (e.g. 4μm) and particles as small as 0.5 μm, can be imaged with reasonable precision in 3D non-destructively.","PeriodicalId":14483,"journal":{"name":"IOP Conference Series: Materials Science and Engineering","volume":"67 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IOP Conference Series: Materials Science and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/1757-899x/1310/1/012027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In AlSi10Mg samples manufactured by Laser Powder Bed Fusion, distinguishing the Si eutectic network/Si particles from the Al matrix by X-ray imaging is challenging due to the low absorption contrast between the Al and Si. This work investigates the possibility of overcoming this obstacle in synchrotron transmission X-ray microscopy. Effects of both different defocusing conditions and X-ray beam energies are evaluated and optimal conditions are identified for imaging a sample annealed post-print for 2h at 520°C. It is shown that both large particles (e.g. 4μm) and particles as small as 0.5 μm, can be imaged with reasonable precision in 3D non-destructively.
在通过激光粉末床熔融技术制造的 AlSi10Mg 样品中，由于 Al 和 Si 之间的吸收对比度较低，通过 X 射线成像将 Si 共晶网络/Si 颗粒与 Al 基体区分开来具有挑战性。这项研究探讨了在同步辐射透射 X 射线显微镜中克服这一障碍的可能性。研究评估了不同散焦条件和 X 射线束能量的影响，并确定了在 520°C 下对退火后印刷 2 小时的样品进行成像的最佳条件。结果表明，无论是大颗粒（如 4 微米）还是小至 0.5 微米的颗粒，都能以合理的精度进行三维无损成像。
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