{"title":"Radiation Effects in VLSI Circuits – Part I: Historical Perspective","authors":"Aryan Kannaujiya, Ambika Prasad Shah","doi":"10.1080/02564602.2024.2380904","DOIUrl":null,"url":null,"abstract":"This review explains the historical perspective of single-event effects, single-event transitions, and single-event upsets. It delves into the concept of critical charge and offers a comprehensive ...","PeriodicalId":13252,"journal":{"name":"IETE Technical Review","volume":"1 1","pages":""},"PeriodicalIF":2.5000,"publicationDate":"2024-08-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IETE Technical Review","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1080/02564602.2024.2380904","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This review explains the historical perspective of single-event effects, single-event transitions, and single-event upsets. It delves into the concept of critical charge and offers a comprehensive ...
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IETE Technical Review is a world leading journal which publishes state-of-the-art review papers and in-depth tutorial papers on current and futuristic technologies in the area of electronics and telecommunications engineering. We also publish original research papers which demonstrate significant advances.
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