{"title":"Overview of analysis on thermal stability and Hirshfeld surface of sodium sulphamate single crystals","authors":"N. Sarkar, Kiran, N. Vijayan, Divyansh Joshi","doi":"10.1007/s10854-024-13412-8","DOIUrl":null,"url":null,"abstract":"<p>Here, we describe the growth of a needle-shaped single crystal of sodium sulphamate through the slow evaporation solution technique. The resultant crystal structure was meticulously confirmed using X-ray diffraction and Fourier transform infrared spectroscopy. Thermal analysis serves as a unique fingerprint for materials, offering distinct characteristics for identification and characterization. The distinctive thermal responses and stability of the titled compound were evaluated through thermogravimetry, differential thermal analysis, and derivative thermogravimetry (DTG). Thermal analysis helps in studying the degradation of materials, which is important for understanding their environmental impact and lifecycle. DTG curves were adeptly employed within this analysis framework to determine activation energy using a linear plotting approach. For deeper insights into intermolecular interactions, Hirshfeld surface computations were carried out using the Crystal Explorer software. Hirshfeld surfaces provide a visual and quantitative way to analyse and understand intermolecular interactions within a crystal structure. This exploration provides a window into the material’s inherent bonding dynamics.</p>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":null,"pages":null},"PeriodicalIF":2.8000,"publicationDate":"2024-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1007/s10854-024-13412-8","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Here, we describe the growth of a needle-shaped single crystal of sodium sulphamate through the slow evaporation solution technique. The resultant crystal structure was meticulously confirmed using X-ray diffraction and Fourier transform infrared spectroscopy. Thermal analysis serves as a unique fingerprint for materials, offering distinct characteristics for identification and characterization. The distinctive thermal responses and stability of the titled compound were evaluated through thermogravimetry, differential thermal analysis, and derivative thermogravimetry (DTG). Thermal analysis helps in studying the degradation of materials, which is important for understanding their environmental impact and lifecycle. DTG curves were adeptly employed within this analysis framework to determine activation energy using a linear plotting approach. For deeper insights into intermolecular interactions, Hirshfeld surface computations were carried out using the Crystal Explorer software. Hirshfeld surfaces provide a visual and quantitative way to analyse and understand intermolecular interactions within a crystal structure. This exploration provides a window into the material’s inherent bonding dynamics.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.