Prognostic Monitoring of Power QFN Packages With Silver Sintered Die-Attach Materials

IF 3 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Components, Packaging and Manufacturing Technology Pub Date : 2024-08-14 DOI:10.1109/TCPMT.2024.3443530
Henry A. Martin;Dong Hu;Xu Liu;René H. Poelma;Edsger C. P. Smits;Willem D. van Driel;GuoQi Zhang
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Abstract

Prognostic monitoring of power quad flat no-lead (PQFN) packages with four distinct silver pastes, each varying in material composition (pure-Ag and resin-reinforced hybrid-Ag) and sintering processes (pressure-assisted and pressureless), was investigated in this study. The PQFN packages with silver sintered die-attach materials were subjected to thermal cycling tests ( $- 55~^{\circ } $ C to $150~^{\circ } $ C), and the performance degradation was evaluated based on the following metrics: 1) electrical on -state resistance $R_{\textrm {DSon}}$ monitored periodically at specific thermal cycling intervals and 2) transient thermal impedance $Z_{\textrm {th}}$ ( $t =0.1$ s) monitored online during thermal cycling. These measurements were further validated using acoustic microscopy imaging and cross-sectional inspection. The pressureless Ag-sintering material demonstrated comparable performance to pressure-assisted Ag-sintering, with a dense microstructure, and consistent electrical and stable thermal performance. Whereas the pressureless resin-reinforced hybrid-Ag material exhibited degradation with a relative increase of ~33% in $R_{\textrm {DSon}}$ , ~38% in $Z_{\textrm {th}}$ ( $t =0.1$ s), and ~67% delamination of the die-attach interface over 1000 cycles. These findings suggest that pressureless Ag-sintering may offer a viable alternative to pressure-assisted methods for lead (Pb)-free die-attachments, while resin-reinforced hybrid-Ag requires further development for improved thermomechanical reliability.
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使用银烧结芯片连接材料的功率 QFN 封装的预测性监测
在这项研究中,研究了四种不同的银糊(材料组成(纯银和树脂增强混合银)和烧结工艺(压力辅助和无压力)不同的电力四平无铅(PQFN)封装的预后监测。采用银烧结模贴材料对PQFN封装进行热循环测试($- 55~^{\circ}$ C至$150~^{\circ}$ C),并根据以下指标评估性能退化:1)在特定热循环间隔定期监测导通电阻$R_{\textrm {DSon}}$, 2)热循环期间在线监测瞬态热阻抗$Z_{\textrm {th}}$ ($t =0.1$ s)。使用声学显微镜成像和横断面检查进一步验证了这些测量结果。无压银烧结材料表现出与压力辅助银烧结相当的性能,具有致密的微观结构,一致的电学和稳定的热性能。而无压树脂增强混合ag材料在1000次循环中表现出降解,在$R_{\textrm {DSon}}$中相对增加~33%,在$Z_{\textrm {th}}$中相对增加~38% ($t =0.1$ s),模附界面分层~67%。这些发现表明,无压银烧结可能为无铅(Pb)模具附件的压力辅助方法提供可行的替代方案,而树脂增强混合银需要进一步发展以提高热机械可靠性。
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来源期刊
IEEE Transactions on Components, Packaging and Manufacturing Technology
IEEE Transactions on Components, Packaging and Manufacturing Technology ENGINEERING, MANUFACTURING-ENGINEERING, ELECTRICAL & ELECTRONIC
CiteScore
4.70
自引率
13.60%
发文量
203
审稿时长
3 months
期刊介绍: IEEE Transactions on Components, Packaging, and Manufacturing Technology publishes research and application articles on modeling, design, building blocks, technical infrastructure, and analysis underpinning electronic, photonic and MEMS packaging, in addition to new developments in passive components, electrical contacts and connectors, thermal management, and device reliability; as well as the manufacture of electronics parts and assemblies, with broad coverage of design, factory modeling, assembly methods, quality, product robustness, and design-for-environment.
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IEEE Transactions on Components, Packaging and Manufacturing Technology Information for Authors IEEE Transactions on Components, Packaging and Manufacturing Technology Society Information 2025 Index IEEE Transactions on Components, Packaging and Manufacturing Technology Vol. 15 IEEE Transactions on Components, Packaging and Manufacturing Technology Society Information IEEE Transactions on Components, Packaging and Manufacturing Technology Information for Authors
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