Manal F. Abou Taleb, F. Afzal, Q. Hussain, Mohamed M. Ibrahim, Zeinhom M. El-Bahy, A. U. Rahman
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引用次数: 0
Abstract
This study explores the impact of crystallite size on the opto-dielectric properties of LiCu0.5Fe2-yCeyO4 (y = 0.0, 0.01, 0.02, 0.03, 0.04) nanospinel ferrites (NSFs) synthesized via sol–gel auto-combustion. X-ray diffraction (XRD) analysis confirmed the crystalline nature and phase purity, revealing variations in crystallite size within the nanoscale range. Fourier-transform infrared spectroscopy (FTIR) provided insights into chemical bonding, affirming the composition and structure reliability. Morphological characterization via scanning electron microscopy (SEM) and transmission electron microscopy (TEM) revealed the nanostructure, highlighting the influence of crystallite size on particle morphology, shape, and size distribution. Energy-dispersive X-ray spectroscopy (EDX) verified the presence of expected elements, with elemental composition offering spatial distribution insights. Inductively coupled plasma (ICP) analysis quantified elemental concentrations, focusing on Li, Cu, Fe, and Ce. Optical properties, including UV–vis absorption spectra, were measured to assess band gap energies. Dielectric measurements across a range of frequencies provided insights into the pure Li-Cu NSFs and Ce3+ doped Li-Cu NSFs dielectric response, revealing variations in dielectric constant and loss tangent with changing crystallite size. The findings highlighted the significant role of crystallite size in modulating both energy band gap and dielectric properties, essential for applications in high-frequency, photonics, electronics, and sensor technologies.
期刊介绍：
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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