Optical Wavelength Calibration for Stabilized He–Ne laser 633 nm Using Substitution Method

IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION MAPAN Pub Date : 2024-09-18 DOI:10.1007/s12647-024-00769-8
Asep Hapiddin, Denny Hermawanto, Yonan Prihapso, Ninuk R. Prasasti, Mohamad Syahadi, Okasatria Novyanto, Dwi Hanto
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Abstract

There is a constant need to regularly calibrate He–Ne laser sources to ensure their precision in various applications. However, such calibration systems are currently not available in Indonesia. For this reason, developing a decent calibration system capable of maintaining He–Ne laser traceability is essential. This paper studies the realization of substitution methods to calibrate stabilized He–Ne lasers. The wavelength of the stabilized He–Ne laser to be calibrated (DUC) and the reference He–Ne laser (Agilent 5519B) were measured by a wavelength meter, Advantest (Q8326), that has sufficient short-time stability. The calculated ratio between both wavelengths was used as a reference value in determining the wavelength of the DUC laser. A calibration of laser head Polytec OPV-503 at 632.8 nm with instability 1.5 × 10−5, was performed to validate the method. It was found that the DUC has a wavelength of (632.9907 ± 0.0001) nm. The result shows that the calibration system can be used to establish traceability to the SI unit of the metre, particularly for the He–Ne laser with stability greater than 0.0001 nm that we expect to be sufficient for laser displacement interferometer applications, e.g., as the primary standard in vibration calibration.

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使用置换法校准 633 nm 稳定氦氖激光器的光波长
人们一直需要定期校准氦氖激光源,以确保其在各种应用中的精度。然而,印度尼西亚目前还没有此类校准系统。因此,开发一个能够保持 He-Ne 激光溯源性的像样校准系统至关重要。本文研究了实现替代方法来校准稳定的 He-Ne 激光器。待校准的稳定氦氖激光器(DUC)和参考氦氖激光器(Agilent 5519B)的波长由具有足够短时间稳定性的 Advantest (Q8326) 波长计测量。在确定 DUC 激光器的波长时,将计算出的两个波长之间的比率作为参考值。对波长为 632.8 nm、不稳定性为 1.5 × 10-5 的激光头 Polytec OPV-503 进行了校准,以验证该方法。结果发现,DUC 的波长为 (632.9907 ± 0.0001) nm。结果表明,该校准系统可用于建立与国际单位制米的溯源性,特别是对于稳定性大于 0.0001 nm 的氦氖激光器,我们预计它足以用于激光位移干涉仪应用,例如作为振动校准的主要标准。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
MAPAN
MAPAN 工程技术-物理:应用
CiteScore
2.30
自引率
20.00%
发文量
91
审稿时长
3 months
期刊介绍: MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology. The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.
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