Delineation of the impact on temporal behaviors of off-axis photoemission in an ultrafast electron microscope.

IF 1.3 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION Review of Scientific Instruments Pub Date : 2024-09-01 DOI:10.1063/5.0222993
Jialiang Chen, Simon A Willis, David J Flannigan
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Abstract

Efforts to push the spatiotemporal imaging-resolution limits of femtosecond laser-driven ultrafast electron microscopes (UEMs) to the combined angstrom-fs range will benefit from stable sources capable of generating high bunch charges. Recent demonstrations of unconventional off-axis photoemitting geometries are promising, but connections to the observed onset of structural dynamics are yet to be established. Here we use the in-situ photoexcitation of coherent phonons to quantify the relative time-of-flight (r-TOF) of photoelectron packets generated from the Ni Wehnelt aperture and from a Ta cathode set-back from the aperture plane. We further support the UEM experiments with particle-tracing simulations of the precise electron-gun architecture and photoemitting geometries. In this way, we measure discernible shifts in electron-packet TOF of tens of picoseconds for the two photoemitting surfaces. These shifts arise from the impact that the Wehnelt-aperture off-axis orientation has on the electron-momentum distribution, which modifies both the collection efficiency and the temporal-packet distribution relative to on-axis emission. Future needs are identified; we expect this and other developments in UEM electron-gun configuration to expand the range of material phenomena that can be directly imaged on scales commensurate with fundamental structural dynamics.

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超快电子显微镜中的离轴光发射对时间行为的影响。
要将飞秒激光驱动超快电子显微镜(UEM)的时空成像分辨率极限提升到埃弗范围,必须要有能够产生高束电荷的稳定光源。最近展示的非常规离轴光发射几何形状很有希望,但与观察到的结构动态的开始之间的联系尚未建立。在这里,我们利用相干声子的原位光激发来量化从 Ni Wehnelt 孔径和从背离孔径平面的 Ta 阴极产生的光电子包的相对飞行时间 (r-TOF)。我们还通过对精确的电子枪结构和光发射几何形状进行粒子跟踪模拟,进一步支持 UEM 实验。通过这种方法,我们测量到两个光发射表面的电子包 TOF 发生了数十皮秒的明显偏移。这些变化是由于韦氏孔径离轴方向对电子动量分布的影响造成的,它改变了收集效率和相对于同轴发射的时间包分布。我们已经确定了未来的需求;我们希望这项研究以及 UEM 电子枪配置方面的其他发展能够扩大可直接成像的材料现象的范围,使其达到与基本结构动态相称的尺度。
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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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