Multiwire Position-Sensitive Neutron Detector with Two Layers of Boron-10

S. I. Potashev, A. A. Afonin, Yu. M. Burmistrov, A. I. Drachev, A. A. Kasparov, S. Kh. Karaevsky, I. V. Meshkov, V. N. Ponomarev, V. I. Razin
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Abstract

Multiwire position-sensitive neutron detector with two layers of boron-10 has been developed to detect both thermal and fast neutrons. Sensitive dimensions of two coordinate neutron detectors are 50 × 50 mm. New detector characteristics are compared with those of a 100 × 100 mm detector built earlier which we used in neutron flux spatial distribution measurements. Plane-parallel design of the new detector has symmetrical structure with respect to wire anode and also includes two intermediate grids and two cathodes made of parallel wires with 2 mm pitch and two silicon substrates coated with boron-10 layers of 0.003 mm thickness. Detector geometry and working gas mixture and pressure are chosen so as to ensure full absorption of secondary alpha particle from reaction with thermal neutron within detector gas medium half thickness. Neutron coordinates are determined from measured ionization loss pulse heights produced by secondary nuclei. The detector expected efficiency to thermal neutrons is about 5%. The detector can be used in small-angle and diffraction scattering setups in condensed matter physics.

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双层硼-10 多线位置敏感中子探测器
已开发出具有两层硼-10 的多线位置敏感中子探测器,可探测热中子和快中子。两坐标中子探测器的灵敏尺寸为 50 × 50 毫米。我们将新探测器的特性与早先制造的 100 × 100 毫米探测器的特性进行了比较,后者曾用于中子通量空间分布测量。新探测器的平面平行设计具有与金属丝阳极对称的结构,还包括两个中间网格和两个阴极,由间距为 2 毫米的平行金属丝和两个涂有 0.003 毫米厚的硼-10 层的硅基板制成。探测器的几何形状和工作气体混合物及压力的选择,是为了确保在探测器气体介质的一半厚度内,与热中子反应产生的二次α粒子被完全吸收。中子坐标是根据测量到的二次核产生的电离损耗脉冲高度确定的。探测器对热中子的预期效率约为 5%。该探测器可用于凝聚态物理学中的小角和衍射散射装置。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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