{"title":"Comparative Analysis of the Surface Morphology of Dense Membrane Filters Pd95Pb5 and Pd93.5In6.0Ru0.5","authors":"O. V. Akimova, T. P. Kaminskaya, S. V. Gorbunov","doi":"10.1134/S1027451024700691","DOIUrl":null,"url":null,"abstract":"<p>Surface morphology features of dense palladium-based membrane filters are studied using atomic force microscopy and scanning electron microscopy methods. Elemental compositions of the filters are Pd<sub>95</sub>Pb<sub>5</sub> and Pd<sub>93.5</sub>In<sub>6.0</sub>Ru<sub>0.5</sub> (hereafter, numerical coefficients mean the composition in wt %). The thickness of the dense membrane filters is 50 and 70 µm, respectively. High-purity metal samples are obtained by methods of electric arc fusion in a protective atmosphere and cold rolling with intermediate vacuum annealing. There are differences in morphology of the filter surface due to the elemental composition of the alloys. Manifestations of cavitation in the form of µm-sized funnels are found upon palladium doping with lead, and there are no such funnels for palladium alloyed with indium and ruthenium. Differences in the surface roughness of the samples are revealed. Surface areas of different hardness are detected using atomic force microscopy in the lateral force contrast mode. The obtained results are important not only for the choice of material for the manufacture of membrane filters with improved performance characteristics but also for the development of the elemental composition of membrane filters in order to optimize their operation in high-tech modern technological processes.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 4","pages":"950 - 957"},"PeriodicalIF":0.5000,"publicationDate":"2024-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024700691","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
Surface morphology features of dense palladium-based membrane filters are studied using atomic force microscopy and scanning electron microscopy methods. Elemental compositions of the filters are Pd95Pb5 and Pd93.5In6.0Ru0.5 (hereafter, numerical coefficients mean the composition in wt %). The thickness of the dense membrane filters is 50 and 70 µm, respectively. High-purity metal samples are obtained by methods of electric arc fusion in a protective atmosphere and cold rolling with intermediate vacuum annealing. There are differences in morphology of the filter surface due to the elemental composition of the alloys. Manifestations of cavitation in the form of µm-sized funnels are found upon palladium doping with lead, and there are no such funnels for palladium alloyed with indium and ruthenium. Differences in the surface roughness of the samples are revealed. Surface areas of different hardness are detected using atomic force microscopy in the lateral force contrast mode. The obtained results are important not only for the choice of material for the manufacture of membrane filters with improved performance characteristics but also for the development of the elemental composition of membrane filters in order to optimize their operation in high-tech modern technological processes.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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