Oier Arcelus, Juan Rodríguez-Carvajal, Nebil A. Katcho, Marine Reynaud, Ashley P. Black, Dimitrios Chatzogiannakis, Carlos Frontera, Jon Serrano-Sevillano, Maha Ismail, Javier Carrasco, Francois Fauth, M. Rosa Palacin, Montse Casas-Cabanas
{"title":"FullProfAPP: a graphical user interface for the streamlined automation of powder diffraction data analysis","authors":"Oier Arcelus, Juan Rodríguez-Carvajal, Nebil A. Katcho, Marine Reynaud, Ashley P. Black, Dimitrios Chatzogiannakis, Carlos Frontera, Jon Serrano-Sevillano, Maha Ismail, Javier Carrasco, Francois Fauth, M. Rosa Palacin, Montse Casas-Cabanas","doi":"10.1107/S1600576724006885","DOIUrl":null,"url":null,"abstract":"<p><i>FullProfAPP</i> is a software tool for data processing, refinement and visualization of large collections of powder diffraction patterns. Featuring an intuitive graphical user interface, it seamlessly facilitates a variety of tasks. These include conducting full-profile phase searches, sequential and high-throughput Rietveld refinements, and managing background (and peak) detection. <i>FullProfAPP</i> also provides convenient interaction with crystallographic databases and supports the visualization and export of high-quality pixel and vector graphics depicting the refinement results, among other functionalities. <i>FullProfAPP</i> wraps around the refinement program <i>FullProf</i> [Rodríguez-Carvajal (1993), <i>Physica B</i>, <b>192</b>, 55–69] and offers the flexibility of user-defined workflows by accessing and editing <i>FullProf</i>'s input files and triggering its execution as necessary. <i>FullProfAPP</i> is distributed as open-source software and is presently available for Windows and Linux operating systems.</p>","PeriodicalId":48737,"journal":{"name":"Journal of Applied Crystallography","volume":"57 5","pages":"1676-1690"},"PeriodicalIF":5.2000,"publicationDate":"2024-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Crystallography","FirstCategoryId":"88","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1107/S1600576724006885","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"CHEMISTRY, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
FullProfAPP is a software tool for data processing, refinement and visualization of large collections of powder diffraction patterns. Featuring an intuitive graphical user interface, it seamlessly facilitates a variety of tasks. These include conducting full-profile phase searches, sequential and high-throughput Rietveld refinements, and managing background (and peak) detection. FullProfAPP also provides convenient interaction with crystallographic databases and supports the visualization and export of high-quality pixel and vector graphics depicting the refinement results, among other functionalities. FullProfAPP wraps around the refinement program FullProf [Rodríguez-Carvajal (1993), Physica B, 192, 55–69] and offers the flexibility of user-defined workflows by accessing and editing FullProf's input files and triggering its execution as necessary. FullProfAPP is distributed as open-source software and is presently available for Windows and Linux operating systems.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.