Non-concentration quenching and good thermal stability in Sr3NaY(PO4)3F:Eu3+ Phosphors

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2024-10-21 DOI:10.1007/s10854-024-13673-3
Jinsu Zhang, Mingwu Li, Jinping Bai, Bingye Zhang, Yongze Cao, Yichao Wang, Xizhen Zhang, Baojiu Chen
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Abstract

Various red phosphors are usually designed to supplement the red component of traditional YAG: Ce3+ phosphor to realize the high-quality WLED. However, the majority of the materials are suffered from the serious concentration quenching and temperature quenching of the activators. In the present work, non-concentration quenching Sr3NaY(PO4)3F: Eu3+ (SNYPF: Eu3+) phosphors were prepared by high-temperature solid-state reaction. The emission intensities of the samples increase continuously with the increase of Eu3+ doped concentration from 0.01 mol to 1 mol. The non-concentration quenching behavior can be explained by calculating the value of the critical distance between Eu3+- Eu3+ ions in SNEuPF. The average lifetimes of the 5D0 energy level of SNYPF: Eu3+ are obtained at different Eu3+ concentration, which are determined to be ~ 2.3 ms and scarcely varies with concentrations. Furthermore, the SNYPF: Eu3+ phosphors exhibit good temperature characteristics. At the general working temperature of WLEDs (400 K), the emission intensity of SNEuPF remains 80.3% of the initial intensity. The results suggest that the SNEuPF phosphor can be regarded as a potential red component to realize high-quality wLEDs.

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Sr3NaY(PO4)3F:Eu3+ 荧光中的非浓缩淬火和良好热稳定性
为了实现高质量的 WLED,通常会设计各种红色荧光粉来补充传统 YAG:Ce3+ 荧光粉的红色成分。然而,大多数材料都存在严重的活化剂浓度淬火和温度淬火问题。本研究通过高温固态反应制备了无浓度淬灭的 Sr3NaY(PO4)3F: Eu3+ (SNYPF: Eu3+)荧光粉。样品的发射强度随着 Eu3+ 掺杂浓度从 0.01 摩尔到 1 摩尔的增加而持续上升。通过计算 SNEuPF 中 Eu3+- Eu3+ 离子之间的临界距离值,可以解释这种非浓度淬灭行为。在不同的 Eu3+ 浓度下,SNYPF:Eu3+ 的 5D0 能级的平均寿命约为 2.3 毫秒,且几乎不随浓度变化。此外,SNYPF: Eu3+ 荧光粉还具有良好的温度特性。在 WLED 的一般工作温度(400 K)下,SNEuPF 的发射强度保持在初始强度的 80.3%。结果表明,SNEuPF 荧光粉可被视为实现高质量 WLED 的潜在红色成分。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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