Abdul Aziz , Md. Asaf-uddowla Golap , Md. Rahat Ebne Alamgir Porosh , Md. Tasnimul Khair Tousif , Muhammad Sheikh Sadi
{"title":"Multi-bit error detection and correction technique using HVDK (Horizontal-Vertical-Diagonal-Knight) parity","authors":"Abdul Aziz , Md. Asaf-uddowla Golap , Md. Rahat Ebne Alamgir Porosh , Md. Tasnimul Khair Tousif , Muhammad Sheikh Sadi","doi":"10.1016/j.vlsi.2024.102297","DOIUrl":null,"url":null,"abstract":"<div><div>In a data stream, errors are quite likely to occur and sometimes this is much more terrible. So, data safety is very important in digital systems, especially in critical and real-time systems, microprocessors, embedded systems, computer memory, and data communication. The probability of soft error increases with the exponential rate of increasing transistor per chip, operational voltage, particle strike, condensation of bit-cell area, etc. To ensure data integrity, safety, and system reliability, error detection, and correction are fundamental components of data transmission and storage systems. Existing error correction techniques can solve several bits of error. However, these existing methods are not fully efficient, as some consume a lot of time, space, and bit overhead. An ideal approach will have the potential to minimize all of these parameters. This research paper proposes a novel error correction approach with horizontal, vertical, diagonal, and knight (HVDK) parity bits. This approach has been taken to correct 5-bit errors in 64 bits of data word using the parity-based technique with less bit overhead. Our research advances the knowledge of error correction methods and sheds light on how to pick and use parity bit schemes that are appropriate for different applications.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"100 ","pages":"Article 102297"},"PeriodicalIF":2.2000,"publicationDate":"2024-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926024001615","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
In a data stream, errors are quite likely to occur and sometimes this is much more terrible. So, data safety is very important in digital systems, especially in critical and real-time systems, microprocessors, embedded systems, computer memory, and data communication. The probability of soft error increases with the exponential rate of increasing transistor per chip, operational voltage, particle strike, condensation of bit-cell area, etc. To ensure data integrity, safety, and system reliability, error detection, and correction are fundamental components of data transmission and storage systems. Existing error correction techniques can solve several bits of error. However, these existing methods are not fully efficient, as some consume a lot of time, space, and bit overhead. An ideal approach will have the potential to minimize all of these parameters. This research paper proposes a novel error correction approach with horizontal, vertical, diagonal, and knight (HVDK) parity bits. This approach has been taken to correct 5-bit errors in 64 bits of data word using the parity-based technique with less bit overhead. Our research advances the knowledge of error correction methods and sheds light on how to pick and use parity bit schemes that are appropriate for different applications.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.