Compliance current dependent multilevel resistive switching in Titanium dioxide nanosheet based memory devices

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2024-11-02 DOI:10.1007/s10854-024-13777-w
Vindya Shetty, Shobith M. Shanbogh, P. Anjaneyulu, K. Deepak
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Abstract

The rise of two-dimensional (2D) materials has unveiled numerous potentialities in future logic and memory devices. In this work, a resistive switching memory device based on 2D Titanium dioxide nanosheet (TiO2 NS) is fabricated with a capacitor-like device structure in which TiO2 NS is sandwiched between silver (Ag) and Fluorine-doped tin oxide (FTO) electrodes. The spin-coating method is used to coat the hydrothermally synthesized TiO2 NS on the FTO substrate and then silver paint is used as top contact to complete the device Ag/TiO2 NS/FTO. Here, TiO2 NS based resistive switching device also called as memristor shows co-existence of bipolar and unipolar resistive switching depending on the voltage sweep direction. The device is suitable for memory applications as its ON/OFF current ratio is of the order 102. The memory device shows 24 multiple resistive states (equivalent to 4.5 bits), which are obtained by tuning the compliance current from 0.2 to 4.8 mA. The multilevel resistive switching (RS) realized is attributed to the evolution and rupture of conductive filament in the TiO2 NS. A retention test for multiple resistive states is conducted and it shows a stability up to 5 × 103 s. The device also showed good endurance for 5 × 103 cycles without any fluctuations in performance.

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基于二氧化钛纳米片的存储器件中与顺从电流相关的多级电阻开关
二维(2D)材料的兴起为未来的逻辑和存储设备带来了众多潜力。本研究基于二维二氧化钛纳米片(TiO2 NS)制作了一种电阻开关存储器件,其器件结构类似电容器,TiO2 NS夹在银电极(Ag)和掺氟氧化锡电极(FTO)之间。采用旋涂法将热液合成的 TiO2 NS 涂覆在 FTO 基底上,然后用银涂料作为顶触点,完成 Ag/TiO2 NS/FTO 器件。在这里,基于 TiO2 NS 的电阻开关器件(也称为忆阻器)根据电压扫描方向的不同,显示出双极和单极电阻开关并存的现象。该器件适用于存储器应用,因为其导通/关断电流比为 102 量级。该存储器件显示出 24 种多重电阻状态(相当于 4.5 位),可通过调整 0.2 至 4.8 mA 的顺应电流来获得。实现多级电阻开关 (RS) 的原因是二氧化钛 NS 中导电丝的演化和断裂。该器件在 5 × 103 次循环中也表现出良好的耐久性,性能没有任何波动。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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