{"title":"Instrument Detection and Reading Based on Arbitrary Quadrilateral","authors":"Huihui Li;Yulin Feng;Yi Zhao;Qianru Wen;Hang Liu","doi":"10.1109/TIM.2024.3472901","DOIUrl":null,"url":null,"abstract":"Pointer instruments are widely used in various fields due to their simplicity, low cost, strong anti-interference capabilities, and durability. However, manual reading and recognition of these instruments can be complex and labor-intensive. Existing meter recognition algorithms have limitations in dial extraction and reading calculation, which restrict their practical applications. In this article, we propose an instrument detection method based on arbitrary quadrilateral positioning. It directly locates key areas such as pointers and scales, eliminating irrelevant information and simplifying the reading process. By applying perspective transformation to the detected quadrilateral, the instrument is transformed into a front-view state, eliminating the need for time-consuming postprocessing operations. We also propose a reading algorithm that handles missing scales, improving reading accuracy. Experimental results demonstrate that our method outperforms existing algorithms in terms of detection and reading accuracy. Using a self-built instrument dataset, the mean average precision (mAP) is 92.4, and the absolute error of the readings is less than 0.02. It is particularly effective in challenging scenarios involving tilt, rotation, changing lighting, and small targets, making it suitable for real-world applications.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"73 ","pages":"1-9"},"PeriodicalIF":5.6000,"publicationDate":"2024-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10721357/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Pointer instruments are widely used in various fields due to their simplicity, low cost, strong anti-interference capabilities, and durability. However, manual reading and recognition of these instruments can be complex and labor-intensive. Existing meter recognition algorithms have limitations in dial extraction and reading calculation, which restrict their practical applications. In this article, we propose an instrument detection method based on arbitrary quadrilateral positioning. It directly locates key areas such as pointers and scales, eliminating irrelevant information and simplifying the reading process. By applying perspective transformation to the detected quadrilateral, the instrument is transformed into a front-view state, eliminating the need for time-consuming postprocessing operations. We also propose a reading algorithm that handles missing scales, improving reading accuracy. Experimental results demonstrate that our method outperforms existing algorithms in terms of detection and reading accuracy. Using a self-built instrument dataset, the mean average precision (mAP) is 92.4, and the absolute error of the readings is less than 0.02. It is particularly effective in challenging scenarios involving tilt, rotation, changing lighting, and small targets, making it suitable for real-world applications.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.