Self-Powered UV Photodetectors With Ultrahigh Performance Enabled by Graphene Oxide-Modulated CuI Hole Transport Layer

IF 5.3 2区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Advanced Electronic Materials Pub Date : 2024-11-22 DOI:10.1002/aelm.202400769
Baofen Cen, Yabing Wang, Hongrong Zhang, Mingfen Mao, Tengfei Wang, Kaixiang Liu, Qinghong Li, Jing Zhang, Shengyun Luo, Guangcan Luo
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Abstract

The hole transport layer (HTL) with a function of charge extraction and transport plays a pivotal role in enhancing the performance of ultraviolet photodetectors (UV PDs). Herein, a CuI p-type layer modified with graphene oxide (GO) is efficiently employed as the hole extractor for UV PDs based on ZnO nanorod arrays (NRs). The UV PD fabricated on FTO/ZnO NRs/CuI@GO/Au architecture exhibits exceptional performance characteristics including remarkably high responsivity (up to 387 mA W−1), significant specific detectivity (1.7 × 1013 cm Hz1/2 W−1), and rapid rise/decay time (23/16 ns) under self-powered mode. The presence of GO effectively adsorbs and aggregates CuI nanoparticles, resulting in the formation of compact films and reduction in surface trap defects. Furthermore, owing to the strong electronegativity of GO terminated oxygen-containing groups, the work function and band structure of CuI are further optimized, which strengthens the built-in electric field of the ZnO/CuI heterojunction. Meanwhile, the pyroelectric effect of CuI that obstructs the hole transport is suppressed with the addition of GO. These improvements not only improve charge separation and hole extraction efficiencies but also significantly mitigate surface nonradiative charge recombination. This approach provides a novel strategy for optimizing CuI as an immense potential HTL with GO modulation.

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利用氧化石墨烯调制的 CuI 孔传输层实现超高性能自供电紫外线光电探测器
具有电荷萃取和传输功能的空穴传输层(HTL)在提高紫外光检测器(UV PDs)性能方面发挥着关键作用。在此,用氧化石墨烯(GO)修饰的 CuI p 型层被有效地用作基于氧化锌纳米棒阵列(NRs)的紫外光电探测器的空穴萃取层。在 FTO/ZnO NRs/CuI@GO/Au 结构上制造的紫外光分光光度计表现出卓越的性能特征,包括极高的响应度(高达 387 mA W-1)、显著的比检测度(1.7 × 1013 cm Hz1/2 W-1)以及自供电模式下的快速上升/衰减时间(23/16 ns)。GO 的存在有效地吸附和聚集了 CuI 纳米粒子,从而形成了紧凑的薄膜,并减少了表面陷阱缺陷。此外,由于 GO 端接含氧基团的强电负性,CuI 的功函数和能带结构得到了进一步优化,从而增强了 ZnO/CuI 异质结的内置电场。同时,加入 GO 后,阻碍空穴传输的 CuI 热释电效应被抑制。这些改进不仅提高了电荷分离和空穴萃取效率,还大大缓解了表面非辐射电荷重组。这种方法提供了一种新颖的策略,可通过 GO 调节将 CuI 优化为一种潜力巨大的 HTL。
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来源期刊
Advanced Electronic Materials
Advanced Electronic Materials NANOSCIENCE & NANOTECHNOLOGYMATERIALS SCIE-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.00
自引率
3.20%
发文量
433
期刊介绍: Advanced Electronic Materials is an interdisciplinary forum for peer-reviewed, high-quality, high-impact research in the fields of materials science, physics, and engineering of electronic and magnetic materials. It includes research on physics and physical properties of electronic and magnetic materials, spintronics, electronics, device physics and engineering, micro- and nano-electromechanical systems, and organic electronics, in addition to fundamental research.
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