{"title":"Effects of multi-photon states in the calibration of single-photon detectors based on a portable bi-photon source.","authors":"S Pani, D Earl, F E Becerra","doi":"10.1116/5.0233335","DOIUrl":null,"url":null,"abstract":"<p><p>Single-photon detectors (SPDs) are ubiquitous in many protocols for quantum imaging, sensing, and communications. Many of these protocols critically depend on the precise knowledge of their detection efficiency. A method for the calibration of SPDs based on sources of quantum-correlated photon pairs uses single-photon detection to generate heralded single photons, which can be used as a standard of radiation at the single-photon level. These heralded photons then allow for precise calibration of SPDs in absolute terms. In this work, we investigate the absolute calibration of avalanche photodiodes based on a portable, commercial bi-photon source, and investigate the effects of multi-photon events from the spontaneous parametric down conversion (SPDC) process in these sources. We show that the multi-photon character of the bi-photon source, together with system losses, has a significant impact on the achievable accuracy for the calibration of SPDs. However, modeling the expected photon counting statistics from the squeezed vacuum in the SPDC process allows for accurate estimation of the efficiency of SPDs, assuming that the system losses are known. This study provides essential information for the design and optimization of portable bi-photon sources for their application in on-site calibration of SPDs with high accuracy, without requiring any other reference standard.</p>","PeriodicalId":93525,"journal":{"name":"AVS quantum science","volume":"6 4","pages":"045003"},"PeriodicalIF":4.2000,"publicationDate":"2024-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11577339/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"AVS quantum science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1116/5.0233335","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2024/11/18 0:00:00","PubModel":"Epub","JCR":"Q2","JCRName":"QUANTUM SCIENCE & TECHNOLOGY","Score":null,"Total":0}
引用次数: 0
Abstract
Single-photon detectors (SPDs) are ubiquitous in many protocols for quantum imaging, sensing, and communications. Many of these protocols critically depend on the precise knowledge of their detection efficiency. A method for the calibration of SPDs based on sources of quantum-correlated photon pairs uses single-photon detection to generate heralded single photons, which can be used as a standard of radiation at the single-photon level. These heralded photons then allow for precise calibration of SPDs in absolute terms. In this work, we investigate the absolute calibration of avalanche photodiodes based on a portable, commercial bi-photon source, and investigate the effects of multi-photon events from the spontaneous parametric down conversion (SPDC) process in these sources. We show that the multi-photon character of the bi-photon source, together with system losses, has a significant impact on the achievable accuracy for the calibration of SPDs. However, modeling the expected photon counting statistics from the squeezed vacuum in the SPDC process allows for accurate estimation of the efficiency of SPDs, assuming that the system losses are known. This study provides essential information for the design and optimization of portable bi-photon sources for their application in on-site calibration of SPDs with high accuracy, without requiring any other reference standard.
在许多量子成像、传感和通信协议中,单光子探测器(SPD)无处不在。其中许多协议都严重依赖于对其探测效率的精确了解。一种基于量子相关光子对来源的 SPD 校准方法利用单光子检测产生预示单光子,可用作单光子级别的辐射标准。这些预示光子可以对 SPD 进行精确的绝对校准。在这项工作中,我们研究了基于便携式商用双光子源的雪崩光电二极管的绝对校准,并调查了这些光子源中自发参量向下转换(SPDC)过程产生的多光子事件的影响。我们的研究表明,双光子源的多光子特性以及系统损耗对校准 SPD 的可实现精度有重大影响。然而,在已知系统损耗的前提下,通过对 SPDC 过程中挤压真空的预期光子计数统计进行建模,可以准确估算 SPD 的效率。这项研究为便携式双光子源的设计和优化提供了重要信息,使其能够应用于现场高精度校准 SPD,而无需任何其他参考标准。