Laser-driven betatron x rays for high-throughput imaging of additively manufactured materials.

IF 1.7 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION Review of Scientific Instruments Pub Date : 2024-12-01 DOI:10.1063/5.0221606
V Senthilkumaran, N F Beier, S Fourmaux, P Shabaninezhad, J Stinehart, L Zhou, J A Moore, A E Hussein
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Abstract

Betatron x rays from a laser wakefield accelerator provide a new avenue for high-resolution, high-throughput radiography of solid materials. Here, we demonstrate the optimization of betatron x rays for three-dimensional tomography of defects in additively manufactured (AM) alloys at a repetition rate of 2.5 Hz. Using the Advanced Laser Light Source in Varennes, Qc, we characterized the x-ray energy spectrum, spatial resolution, beam stability, and emission length from three different gas targets {He, N2, and He-N2 [He (99.5%) + N2 (0.5%)] mixture} to determine the conditions for optimized imaging resolution with minimized acquisition time. Mixed He-N2 produced the highest x-ray critical energy (19 ± 5) keV and average brightness (∼3.3×1010 photons/s/mm2/mrad2/0.1% BW) vs pure N2 gas (12 ± 4 keV and ∼1.6×1010 photons/s/mm2/mrad2/0.1% BW). The mixed gas demonstrated the best beam stability and pointing compared to pure He gas. The optimization of betatron sources at 2.5 Hz for high-resolution imaging of micrometer-scale defects in AM alloys will enable high-throughput data collection, accelerating the characterization of complex mechanical deformation processes in these materials.

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用于增材制造材料高通量成像的激光驱动倍频x射线。
来自激光尾流场加速器的Betatron x射线为固体材料的高分辨率,高通量射线照相提供了新的途径。在这里,我们展示了以2.5 Hz的重复频率对增材制造(AM)合金缺陷进行三维断层扫描的betatron x射线优化。利用法国瓦伦纳的先进激光光源,我们对三种不同气体目标(He、N2和He-N2 [He (99.5%) + N2(0.5%)]混合物)的x射线能谱、空间分辨率、光束稳定性和发射长度进行了表征,以确定在最短采集时间下优化成像分辨率的条件。混合He-N2产生最高的x射线临界能量(19±5)keV和平均亮度(~ 3.3×1010光子/s/mm2/mrad2/0.1% BW),而纯N2气体(12±4 keV和~ 1.6×1010光子/s/mm2/mrad2/0.1% BW)。与纯He气体相比,混合气体表现出最好的光束稳定性和指向性。优化2.5 Hz的betatron源,用于AM合金微米级缺陷的高分辨率成像,将实现高通量数据收集,加速表征这些材料的复杂机械变形过程。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
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