Investigation of defect centres in porous structure of nickel oxide synthesized by ecofriendly route for photocatalytic application

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2024-12-16 DOI:10.1007/s10854-024-13954-x
Srimathi Krishnaswamy, Puspamitra Panigrahi, Ganapathi Subramanian Nagarajan, Akshay Panigrahi
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Abstract

Porous nickel oxide nanoparticles were synthesized by solution combustion synthesis method using different concentrations (0.1, 0.2, 0.3 and 0.4 mol) of glycine as fuel and reducing agent. X-ray diffraction (XRD) pattern of the samples showed FCC structure with pure phase for all samples. By tuning the molar ratio of glycine to nickel nitrate, the porosity enhanced which was evidenced by scanning electron microscope (SEM). Transmission electron spectroscopy (TEM) exhibited spherical morphology with 30–40 nm particle size. Specific surface area was done using methylene blue dye method. The optical studies were studied systematically. The optical bandgap decreased on increasing the concentration of glycine. The room temperature Photoluminescence showed band edge emission at 359 nm and defect centres from 400 to 500 nm. The violet luminescent NiO can be used in optoelectronic devices. Porous 0.4 NiO with high defect centres was taken as photocatalyst for Methylene blue degradation under visible light.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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