Structural, Optical, and Magnetic Characteristics of Iron-Garnet Films after Ion Etching

S. V. Tomilin, A. A. Syrov, T. V. Mikhailova, S. D. Lyashko, A. N. Shaposhnikov, A. G. Shumilov, E. Yu. Semuk, A. A. Fedorenko, V. N. Berzhansky, O. A. Tomilina
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Abstract

The experimental results of a study of the influence of ion etching of single-crystal films of cation-substituted iron-garnets on their structural, magnetic, optical, and magneto-optical properties are presented. It is shown that the ion etching of single-crystal garnets significantly reduces the surface roughness. Analysis of the domain structure, ferromagnetic resonance spectra, and magneto-optical hysteresis in the epitaxial film of bismuth-substituted iron-garnet during layer-by-layer ion etching shows the presence of three different layers, the state of which changes relative to the compensation point and the interfaces of the layers correspond to the transition through the compensation point. It is shown that the position of the layer interfaces can be varied by changing the temperature of the sample. A study of optical and magneto-optical characteristics shows that in single-crystal (epitaxial) films of iron-garnets, ion etching does not worsen optical transmission and does not destroy the garnet structure down to a thickness of tens of nanometers (the Faraday effect is preserved).

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离子蚀刻后铁榴石薄膜的结构、光学和磁学特性
本文介绍了研究阳离子取代铁石榴石单晶薄膜的离子蚀刻对其结构、磁性、光学和磁光特性影响的实验结果。研究表明,离子蚀刻单晶石榴石能显著降低表面粗糙度。对逐层离子刻蚀过程中铋取代铁石榴石外延膜的畴结构、铁磁共振谱和磁光滞后的分析表明,存在三个不同的层,其状态相对于补偿点发生变化,各层的界面对应于通过补偿点的过渡。研究表明,层界面的位置可以通过改变样品的温度来改变。对光学和磁光特性的研究表明,在铁石榴石的单晶(外延)薄膜中,离子蚀刻不会使光学传输恶化,也不会破坏厚度达几十纳米的石榴石结构(法拉第效应得以保留)。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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