Features of Layer Formation on the Surface of Valve Metals in the Process of the Ion-Beam-Assisted Deposition of Metals from Vacuum-Arc Discharge Plasma

V. V. Poplavsky, O. G. Bobrovich, A. V. Dorozhko, V. G. Matys
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Abstract

Layers on the surface of aluminum, aluminum alloy, titanium, and tantalum are formed using ion-beam-assisted metal deposition. Deposition of the metal and mixing of the deposited layer with the substrate surface with accelerated (U = 20 kV) ions of the same metal are carried out in an experimental setup, respectively, from the neutral fraction of metal vapor and ionized plasma of a pulsed vacuum (p ~ 10–2 Pa) arc discharge. Multi-component amorphous layers containing atoms of the deposited metal, components of the substrate material including oxygen of the surface oxide film, as well as hydrocarbon molecules as impurities, are obtained. It is established that during the ion-beam-assisted deposition of metals with getter properties (Zr, Cr, Er, Dy, etc.) onto the surface of the materials under study, significant amounts of gases are captured from the residual atmosphere of the vacuum working chamber and included in the composition of the layer being formed. It is noted that the content of atoms of the substrate material in the layer is small. During the ion-beam-assisted deposition of metals which do not exhibit getter properties, the content of impurities in the resulting layers is significantly less; they contain atoms of the deposited metal and the substrate material.

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真空弧放电等离子体离子束辅助沉积金属过程中阀门金属表面层形成的特点
铝、铝合金、钛和钽表面的层是用离子束辅助金属沉积形成的。在脉冲真空(p ~ 10-2 Pa)电弧放电的金属蒸气中性部分和电离等离子体中,分别用加速离子(U = 20 kV)沉积金属和将沉积层与衬底表面混合。得到了含有沉积金属原子的多组分非晶层,包括表面氧化膜的氧在内的衬底材料组分,以及作为杂质的碳氢化合物分子。研究表明,在离子束辅助沉积具有吸气特性的金属(Zr, Cr, Er, Dy等)到所研究材料表面的过程中,从真空工作室内的残余大气中捕获了大量的气体,并包含在正在形成的层的组成中。值得注意的是,衬底材料在层中的原子含量很小。在离子束辅助沉积金属的过程中,其不表现出吸气特性,所得层中的杂质含量显著减少;它们含有沉积的金属和衬底材料的原子。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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