Ti3C2Tx MXene Thin Films and Intercalated Species Characterized by IR-to-UV Broadband Ellipsometry

IF 3.2 3区 化学 Q2 CHEMISTRY, PHYSICAL The Journal of Physical Chemistry C Pub Date : 2024-12-27 DOI:10.1021/acs.jpcc.4c06906
Andreas Furchner, Tetiana Parker, Vincent Mauchamp, Simon Hurand, Julian Plaickner, Jörg Rappich, Aline Alencar Emerenciano, Karsten Hinrichs, Yury Gogotsi, Tristan Petit
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Abstract

MXenes are two-dimensional (2D) materials with versatile applications in optoelectronics, batteries, and catalysis. To unlock their full potential, it is crucial to characterize MXene interfaces and intercalated species in more detail than is currently possible with conventional optical spectroscopies. Here, we combine ultra-broadband ellipsometry and transmission spectroscopy from the mid-infrared (IR) to the deep-ultraviolet (UV) to probe quantitatively the composition, structure, transport, and optical properties of spray-coated Ti3C2Tx MXene thin films with varying material properties. We find film thickness heterogeneity and surface roughness in the low-nanometer range as well as depth-dependent conductivity properties, which we quantify with a graded Drude model. The optically determined sheet resistance is confirmed by four-point probe measurements. Furthermore, we employ density-functional-theory calculations to assign the observed absorption bands in the MXene dielectric function to various interband transitions from mixed MXene surface terminations. The prominent 1.48 eV (833 nm) spectral feature is found to be related to oxygen termination. Additional plasmonic effects are also suggested. Finally, we leverage the chemical sensitivity of state-of-the-art IR ellipsometry to separate the fingerprints of intercalated species within the MXene from the dominant Drude contributions, presenting for the first time a set of infrared optical constants of intercalated water. This work lays the foundation for optical metrology for interface engineering of MXene and other 2D materials.

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Ti3C2Tx MXene薄膜及其插层物质的红外-紫外宽带椭偏仪表征
MXenes是二维(2D)材料,在光电子学,电池和催化方面具有广泛的应用。为了充分发挥其潜力,与目前的传统光谱学相比,更详细地表征MXene界面和插层物质是至关重要的。本文采用超宽带椭偏和中红外至深紫外透射光谱相结合的方法,对不同材料性能的Ti3C2Tx MXene薄膜的组成、结构、输运和光学性能进行了定量研究。我们发现薄膜厚度不均一性和表面粗糙度在低纳米范围内,以及与深度相关的电导率特性,我们用分级德鲁德模型对其进行量化。光学确定的薄片电阻由四点探头测量确认。此外,我们采用密度泛函理论计算将MXene介电函数中观察到的吸收带分配到混合MXene表面末端的各种带间跃迁。突出的1.48 eV (833 nm)光谱特征与氧终止有关。还提出了其他等离子体效应。最后,我们利用最先进的红外椭偏仪的化学灵敏度,从主要的Drude贡献中分离出MXene中插层物质的指纹,首次提出了一套插层水的红外光学常数。本工作为MXene与其他二维材料界面工程的光学计量奠定了基础。
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来源期刊
The Journal of Physical Chemistry C
The Journal of Physical Chemistry C 化学-材料科学:综合
CiteScore
6.50
自引率
8.10%
发文量
2047
审稿时长
1.8 months
期刊介绍: The Journal of Physical Chemistry A/B/C is devoted to reporting new and original experimental and theoretical basic research of interest to physical chemists, biophysical chemists, and chemical physicists.
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