Chaoqun Ge, Liuying Wang, Lixing Wang, Gu Liu, Ying Zhang, Kejun Xu, Long Wang, Mengzhou Chen, Weichao Wang, Jie Huang
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引用次数: 0
Abstract
The metal–organic framework (MOF) derivatives are considered novel microwave absorption material (MAM) with significant potential for applications. However, the challenge persists in achieving MOF-derived MAM with lower filling ratio and wider effective absorption bands. Constructing a uniform carbon nanotube (CNT) interconnected networks to enhance dielectric loss is considered an effective strategy to solve these problems, yet the challenge lies in its construction using a straightforward approach. Herein, we investigated the unique features of MOF as precursors for fabrication of one-dimensional (1D) micro-nano mixed scale hierarchical porous carbon architecture for highly efficient MAM. A uniform CNT interconnected networks on the surface of 1D rod-like MOF derivatives was constructed via a simple self-polymerization and in-situ pyrolysis. The effects of the Co/Zn molar ratio and pyrolysis temperature on the microstructure and microwave absorption performance of the composites were investigated. By controlling the CNT growth and magnetic components content, the composites exhibited outstanding microwave absorption performance and achieved a minimum reflection loss of −55.3 dB at 1.71 mm and maximum effective bandwidth of 5.5 GHz at a thin thickness of 1.82 mm. This work presents a novel approach for the utilization of MOF in fabricating magnetic carbon-based MAM with wide absorption bands and low filler ratios.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.