Band structure and magnetism engineering of InSe monolayers through doping with IVA- and VA-group atoms: role of impurities

IF 4.6 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Nanoscale Advances Pub Date : 2025-01-23 DOI:10.1039/D4NA01013B
Nguyen Thi Han, J. Guerrero-Sanchez and D. M. Hoat
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Abstract

In this work, we investigate the electronic and magnetic properties of the InSe monolayer enriched by doping with IVA-group (Si and Ge) and VA-group (P and As) atoms. Both In and Se sublattices are considered as doping sites to realize n- and p-type doping (XIn@InSe and XSe@InSe systems, X = Si, Ge, P, and As), respectively. The pristine InSe monolayer is an indirect gap semiconductor with a band gap of 1.41 eV. n-Doping processes preserve the monolayer's nonmagnetic nature. IVA-group impurities lead to monolayer metallization, while a considerable band gap reduction is induced by doping with VA-group atoms. The band gap also decreases considerably when realizing p-type doping with IVA-group atoms. In contrast, monolayer magnetization is achieved by p-type doping when replacing Se atoms with P and As atoms, leading to the formation of new 2D magnetic semiconductors. In these cases, VA-group impurities mainly produce the system's magnetism. Furthermore, our calculations also provide evidence for the emergence of magnetism in the InSe monolayer through doping with pair impurities (pX@InSe systems), where Si2/Ge2 (incorporated at the Se sublattice) and P1/As1 (incorporated at the In sublattice) dopant atoms play a key role in determining the electronic and magnetic properties of respective pair-atom-doped systems. Herein, the magnetic semiconductor nature of pSi@InSe and pGe@InSe systems is confirmed, while pAs@InSe is found to be a half-metallic system. Our results suggest the usefulness of doping with IVA- and VA-group atoms that can serve as an effective strategy to functionalize the InSe monolayer, providing insights into the role of impurities.

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通过掺杂 IVA 和 VA 族原子实现硒化铟单层的带状结构和磁性工程:杂质的作用。
在这项工作中,我们研究了通过掺杂iva族(Si和Ge)和va族(P和As)原子富集的InSe单层的电子和磁性能。将In和Se亚晶格作为掺杂位点,分别实现n型和P型掺杂(XIn@InSe和XSe@InSe体系,X = Si, Ge, P和as)。原始的铟硒单层是一种间接隙半导体,带隙为1.41 eV。n掺杂工艺保留了单层膜的非磁性。va -基团杂质导致单层金属化,而va -基团原子掺杂导致带隙大幅缩小。当使用iva基团原子掺杂p型时,带隙也显著减小。相反,当P型掺杂用P和As原子取代Se原子时,可以实现单层磁化,从而形成新的二维磁性半导体。在这些情况下,va族杂质主要产生体系的磁性。此外,我们的计算还为通过掺杂对杂质(pX@InSe体系)在InSe单层中出现磁性提供了证据,其中Si2/Ge2(掺入Se亚晶格)和P1/As1(掺入in亚晶格)掺杂原子在决定各自对原子掺杂体系的电子和磁性方面起着关键作用。本文证实了pSi@InSe和pGe@InSe系的磁性半导体性质,而pAs@InSe系为半金属系。我们的研究结果表明,掺杂IVA-和va -基团原子可以作为一种有效的策略来功能化InSe单层,从而深入了解杂质的作用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Nanoscale Advances
Nanoscale Advances Multiple-
CiteScore
8.00
自引率
2.10%
发文量
461
审稿时长
9 weeks
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