High-Performance Oxide Crystal BaTeW2O9 X-ray Detector with High Stability, Low Detection Limit, and Ultralow Dark Current Drift

IF 8.2 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY ACS Applied Materials & Interfaces Pub Date : 2025-01-28 DOI:10.1021/acsami.4c17909
Feifei Guo, Fuai Hu, Yufei Song, Lei Wang, Zeliang Gao, Xutang Tao
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Abstract

X-ray detection materials and devices have received widespread attention due to their irreplaceable role in the medical, industrial, and military fields. In this paper, BaTeW2O9 (BTW) crystal containing lone pairs of electrons with large atomic numbers and high density is reported as a new type of oxide crystal X-ray detection material. The anisotropic X-ray detection performance of the BTW single crystal (SC) is systematically studied. At 120 keV hard X-ray photon energy, the BTW SC X-ray detectors along the crystallographic a-, b-, and c-axes directions achieved high sensitivities of 371, 404, and 368 μC Gyair–1 cm–2 respectively. More importantly, no dark current drift phenomenon was observed in the BTW SC X-ray detectors. The dark current drifts along the crystallographic a-, b-, and c-axes directions are as low as 7.81 × 10–9, 8.61 × 10–9, and 7.71 × 10–9 nA cm–1 s–1 V–1, respectively. In addition, the BTW SC X-ray detector has an ultralow detection limit of 21.9 nGyair s–1. Our research provides a new X-ray detection material with potential application value and a new material design strategy for the field of radiation detection.

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高稳定性、低检测限、超低暗电流漂移的高性能氧化晶体BaTeW2O9 x射线探测器
x射线检测材料和器件在医疗、工业、军事等领域具有不可替代的作用,受到了广泛的关注。本文报道了一种具有大原子序数和高密度的含孤对电子的BaTeW2O9 (BTW)晶体作为一种新型的氧化物晶体x射线探测材料。系统研究了BTW单晶(SC)的各向异性x射线探测性能。在120 keV的硬x射线光子能量下,BTW SC x射线探测器沿晶体学a、b和c轴方向的灵敏度分别为371、404和368 μC gyir - 1 cm-2。更重要的是,在BTW SC x射线探测器中没有观察到暗电流漂移现象。暗电流沿晶体a、b、c轴方向漂移低,分别为7.81 × 10-9、8.61 × 10-9和7.71 × 10-9 nA cm-1 s-1 V-1。此外,BTW SC x射线探测器具有21.9 nGyair s-1的超低检出限。我们的研究为辐射探测领域提供了一种具有潜在应用价值的新型x射线探测材料和一种新的材料设计策略。
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阿拉丁
WO3
阿拉丁
TeO2
阿拉丁
BaCO3
来源期刊
ACS Applied Materials & Interfaces
ACS Applied Materials & Interfaces 工程技术-材料科学:综合
CiteScore
16.00
自引率
6.30%
发文量
4978
审稿时长
1.8 months
期刊介绍: ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.
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