On the Dependability of Bidirectional Encoder Representations from Transformers (BERT) to Soft Errors

IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Nanotechnology Pub Date : 2025-01-20 DOI:10.1109/TNANO.2025.3531721
Zhen Gao;Ziye Yin;Jingyan Wang;Rui Su;Jie Deng;Qiang Liu;Pedro Reviriego;Shanshan Liu;Fabrizio Lombardi
{"title":"On the Dependability of Bidirectional Encoder Representations from Transformers (BERT) to Soft Errors","authors":"Zhen Gao;Ziye Yin;Jingyan Wang;Rui Su;Jie Deng;Qiang Liu;Pedro Reviriego;Shanshan Liu;Fabrizio Lombardi","doi":"10.1109/TNANO.2025.3531721","DOIUrl":null,"url":null,"abstract":"Transformers are widely used in natural language processing and computer vision, and Bidirectional Encoder Representations from Transformers (BERT) is one of the most popular pre-trained transformer models for many applications. This paper studies the dependability and impact of soft errors on BERT implemented with different floating-point formats using two case studies: sentence emotion classification and question answering. Simulation by error injection is conducted to assess the impact of errors on different parts of the BERT model and different bits of the parameters. The analysis of the results leads to the following findings: 1) in both single and half precision, there is a Critical Bit (CB) on which errors significantly affect the performance of the model; 2) in single precision, errors on the CB may cause overflow in many cases, which leads to a fixed result regardless of the input; 3) in half precision, the errors do not cause overflow but they may still introduce a large accuracy loss. In general, the impact of errors is significantly larger in single-precision than half-precision parameters. Error propagation analysis is also considered to further study the effects of errors on different types of parameters and reveal the mitigation effects of the activation function and the intrinsic redundancy of BERT.","PeriodicalId":449,"journal":{"name":"IEEE Transactions on Nanotechnology","volume":"24 ","pages":"73-87"},"PeriodicalIF":2.1000,"publicationDate":"2025-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10845154/","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

Transformers are widely used in natural language processing and computer vision, and Bidirectional Encoder Representations from Transformers (BERT) is one of the most popular pre-trained transformer models for many applications. This paper studies the dependability and impact of soft errors on BERT implemented with different floating-point formats using two case studies: sentence emotion classification and question answering. Simulation by error injection is conducted to assess the impact of errors on different parts of the BERT model and different bits of the parameters. The analysis of the results leads to the following findings: 1) in both single and half precision, there is a Critical Bit (CB) on which errors significantly affect the performance of the model; 2) in single precision, errors on the CB may cause overflow in many cases, which leads to a fixed result regardless of the input; 3) in half precision, the errors do not cause overflow but they may still introduce a large accuracy loss. In general, the impact of errors is significantly larger in single-precision than half-precision parameters. Error propagation analysis is also considered to further study the effects of errors on different types of parameters and reveal the mitigation effects of the activation function and the intrinsic redundancy of BERT.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
求助全文
约1分钟内获得全文 去求助
来源期刊
IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.30%
发文量
74
审稿时长
8.3 months
期刊介绍: The IEEE Transactions on Nanotechnology is devoted to the publication of manuscripts of archival value in the general area of nanotechnology, which is rapidly emerging as one of the fastest growing and most promising new technological developments for the next generation and beyond.
期刊最新文献
2024 Index IEEE Transactions on Nanotechnology Vol. 23 On the Dependability of Bidirectional Encoder Representations from Transformers (BERT) to Soft Errors Implications of Dielectric Phases in Ferroelectric HfO$_{2}$ Films on the Performance of Negative Capacitance FETs Improvement of Surface Roughness in SiO2 Thin Films via Deuterium Annealing at 300 °C On the Importance of the Metal Catalyst Layer to the Performance of CNT-Based Supercapacitor Electrodes
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1