Minor Au element effects on phase transformation and tensile strength

IF 6.3 3区 工程技术 Q1 ENGINEERING, CHEMICAL Journal of the Taiwan Institute of Chemical Engineers Pub Date : 2025-04-01 Epub Date: 2025-01-25 DOI:10.1016/j.jtice.2025.105991
Yi-Wun Wang , Jang-Cheng Fang
{"title":"Minor Au element effects on phase transformation and tensile strength","authors":"Yi-Wun Wang ,&nbsp;Jang-Cheng Fang","doi":"10.1016/j.jtice.2025.105991","DOIUrl":null,"url":null,"abstract":"<div><h3>Background</h3><div>SnBi is an attractive solder owing to its low cost and step-soldering capability. However, its ductility is lower than that of conventional solder such as SnAgCu. Addition of elements to SnBi can help improve its properties. Au is considered an effective way to improve the undercooling and tensile strength of SnBi.</div></div><div><h3>Methods</h3><div>In this study, a solder joint of Sn56Bi2Au/Cu is reflowed at 160 °C and then subjected to solid–solid reactions from 80 to 130 °C. Fracture morphologies indicate the Au addition increases the joint ductility and reliability.</div></div><div><h3>Significant Findings</h3><div>The addition of minor Au causes needle-type AuSn<sub>4</sub> to disperse in the solder. The (Au,Cu)Sn formed at the interface during the 80 °C solid–solid reaction transforms to (Cu,Au)<sub>6</sub>Sn<sub>5</sub> and Cu<sub>3</sub>Sn as the temperature increases to 100–130 °C. The formation of intermetallic compounds has a significant effect on the reliability. Au–Sn compounds are extremely important in light-emitting diodes, while Cu–Sn compounds are commonly used as connections for die-attached devices. The aim of this study is to investigate the phase transformations among AuSn, AuSn<sub>4</sub>, Cu<sub>6</sub>Sn<sub>5</sub>, and Cu<sub>3</sub>Sn. The effects of Au addition on the microstructure and mechanical properties are also investigated.</div></div>","PeriodicalId":381,"journal":{"name":"Journal of the Taiwan Institute of Chemical Engineers","volume":"169 ","pages":"Article 105991"},"PeriodicalIF":6.3000,"publicationDate":"2025-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of the Taiwan Institute of Chemical Engineers","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1876107025000422","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/1/25 0:00:00","PubModel":"Epub","JCR":"Q1","JCRName":"ENGINEERING, CHEMICAL","Score":null,"Total":0}
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Abstract

Background

SnBi is an attractive solder owing to its low cost and step-soldering capability. However, its ductility is lower than that of conventional solder such as SnAgCu. Addition of elements to SnBi can help improve its properties. Au is considered an effective way to improve the undercooling and tensile strength of SnBi.

Methods

In this study, a solder joint of Sn56Bi2Au/Cu is reflowed at 160 °C and then subjected to solid–solid reactions from 80 to 130 °C. Fracture morphologies indicate the Au addition increases the joint ductility and reliability.

Significant Findings

The addition of minor Au causes needle-type AuSn4 to disperse in the solder. The (Au,Cu)Sn formed at the interface during the 80 °C solid–solid reaction transforms to (Cu,Au)6Sn5 and Cu3Sn as the temperature increases to 100–130 °C. The formation of intermetallic compounds has a significant effect on the reliability. Au–Sn compounds are extremely important in light-emitting diodes, while Cu–Sn compounds are commonly used as connections for die-attached devices. The aim of this study is to investigate the phase transformations among AuSn, AuSn4, Cu6Sn5, and Cu3Sn. The effects of Au addition on the microstructure and mechanical properties are also investigated.

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金元素对相变和抗拉强度的影响较小
snbi因其低成本和步进焊接能力而成为一种有吸引力的焊料。然而,其延展性低于传统焊料,如SnAgCu。向SnBi中添加元素有助于改善其性能。Au被认为是提高SnBi过冷性和抗拉强度的有效途径。方法将Sn56Bi2Au/Cu焊点在160℃回流,然后在80 ~ 130℃进行固-固反应。断口形貌表明,金的加入提高了接头的延展性和可靠性。重要发现:少量Au的加入导致针状AuSn4分散在焊料中。80℃固-固反应形成的(Au,Cu)Sn随着温度升高到100-130℃转变为(Cu,Au)6Sn5和Cu3Sn。金属间化合物的形成对可靠性有重要影响。Au-Sn化合物在发光二极管中非常重要,而Cu-Sn化合物通常用作贴装器件的连接。本研究的目的是研究AuSn、AuSn4、Cu6Sn5和Cu3Sn之间的相变。研究了金的加入对合金显微组织和力学性能的影响。
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来源期刊
CiteScore
9.10
自引率
14.00%
发文量
362
审稿时长
35 days
期刊介绍: Journal of the Taiwan Institute of Chemical Engineers (formerly known as Journal of the Chinese Institute of Chemical Engineers) publishes original works, from fundamental principles to practical applications, in the broad field of chemical engineering with special focus on three aspects: Chemical and Biomolecular Science and Technology, Energy and Environmental Science and Technology, and Materials Science and Technology. Authors should choose for their manuscript an appropriate aspect section and a few related classifications when submitting to the journal online.
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