Marek Kotrlý, Josef Uher, Jan Jakubek, Roman Skála, Jana Boháčová, Ivana Turková, Kamila Starkbaumová
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引用次数: 0
Abstract
The forensic field has until now been missing more versatile equipment for non-destructive characterization, analysis and inspection of 2D and 3D objects. Also, the need for increasingly frequent analysis of art forgeries, where non-destructive analysis is required at least in the first step, is calling for a multimodal solution. A prototype device for robotic analysis, imaging and mapping of 3D objects is being developed and tested to be used in these areas. The system is based on the principle of integrating imaging and analytical technologies onto six-axis robotic arms, which allow substantial flexibility in the sample size or shape. The system enables non-destructive examination of a wide spectrum of samples with complicated curvatures. The new generation of X-ray imaging detectors provide a high picture quality with a spatial resolution level in the micrometre range in 2D or 3D imaging. The basic version of the robotic scanner allows transmission X-ray imaging and mapping of the individual photons with high-sensitivity and high-resolution detectors. The broad capabilities of XRD imaging are now being complemented by X-ray fluorescence point analysis and mapping, multispectral macro imaging, and multispectral X-ray diffraction analysis.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.