Liangzhu Yuan , Jinying Li , Yue Fan , Jianliang Shi , Yongmei Huang
{"title":"Enhancing pointing accuracy in Risley prisms through error calibration and stochastic parallel gradient descent inverse solution method","authors":"Liangzhu Yuan , Jinying Li , Yue Fan , Jianliang Shi , Yongmei Huang","doi":"10.1016/j.precisioneng.2024.12.008","DOIUrl":null,"url":null,"abstract":"<div><div>High-precision pointing is crucial in evaluating the effectiveness of beam control technology. However, devices utilizing compact rotational Risley prisms (RRP) face a challenge in balancing field-of-view (FOV) and pointing accuracy. This study aims to develop a beam pointing model for RRP and enhance pointing accuracy through error calibration using the system identification method. Moreover, the current two-step inverse solution method is inadequate when the beam deflection model includes the prism's tilt error. To overcome this limitation, this study proposes a stochastic parallel gradient descent (SPGD) inverse solution method to further improve the system's pointing accuracy. A RRP system with a FOV of <span><math><mrow><mo>±</mo><msup><mn>15</mn><mo>∘</mo></msup></mrow></math></span> was constructed for experimentation. The results indicate the pointing accuracy is 2.8 arcsec, the angular dynamic range is 46 dB, and the root-mean-square errors (RMSE) in the x- and y-directions are 1.2 arcsec and 0.9 arcsec, respectively. This device exhibits the highest angular dynamic range among existing RRP devices.</div></div>","PeriodicalId":54589,"journal":{"name":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","volume":"93 ","pages":"Pages 37-45"},"PeriodicalIF":3.5000,"publicationDate":"2024-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S014163592400285X","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}
引用次数: 0
Abstract
High-precision pointing is crucial in evaluating the effectiveness of beam control technology. However, devices utilizing compact rotational Risley prisms (RRP) face a challenge in balancing field-of-view (FOV) and pointing accuracy. This study aims to develop a beam pointing model for RRP and enhance pointing accuracy through error calibration using the system identification method. Moreover, the current two-step inverse solution method is inadequate when the beam deflection model includes the prism's tilt error. To overcome this limitation, this study proposes a stochastic parallel gradient descent (SPGD) inverse solution method to further improve the system's pointing accuracy. A RRP system with a FOV of was constructed for experimentation. The results indicate the pointing accuracy is 2.8 arcsec, the angular dynamic range is 46 dB, and the root-mean-square errors (RMSE) in the x- and y-directions are 1.2 arcsec and 0.9 arcsec, respectively. This device exhibits the highest angular dynamic range among existing RRP devices.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.