Correlation between linear conductance variability and accuracy in neuromorphic computing using AuNP-DNA/HfO2 bilayer memristor devices

IF 5.6 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY Measurement Pub Date : 2025-05-15 Epub Date: 2025-02-06 DOI:10.1016/j.measurement.2025.116960
Myoungsu Chae , Doowon Lee , Hyunbin Lee , Yuseong Jang , Taegi Kim , Youngeun Kim , Hee-Dong Kim
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Abstract

Memristor-based neuromorphic computing needs to improve energy efficiency using eco-friendly materials, but a single active layer with traditional materials still requires an improvement in reliability and performance. We propose a bilayers-memristor with gold nanoparticle (AuNP)-DNA for artificial synapse applications. As a result, the HfO2/AuNP-DNA-based memristor exhibits excellent linear weight update and large conductance ratio characteristics with high reliability and tunability. The high linearity of synaptic weights, achieved through simple programming according to pulse amplitude, can particularly enhance the device’s energy efficiency and learning accuracy in neural network applications. We assess the accuracy of the modified national institute of standards and technology simulations to compare the classification accuracy depending on linearity and the ratio of weight update. As a result, the smallest validation loss is observed at –7 V depression voltage, which has the best linearity and optimal conductance ratio, suggesting the potential application of the proposed memristor in neuromorphic computing.
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使用AuNP-DNA/HfO2双层记忆电阻器器件的神经形态计算中线性电导可变性与准确性的相关性
基于忆阻器的神经形态计算需要使用环保材料来提高能源效率,但是使用传统材料的单一有源层仍然需要提高可靠性和性能。我们提出了一种用于人工突触应用的金纳米颗粒(AuNP)-DNA双层记忆电阻器。因此,基于HfO2/ aunp - dna的忆阻器具有良好的线性重量更新和大电导比特性,具有高可靠性和可调性。根据脉冲幅度通过简单的编程实现突触权重的高线性,可以特别提高设备在神经网络应用中的能效和学习精度。我们评估了修改后的国家标准研究所和技术模拟的精度,比较了线性度和权重更新比对分类精度的影响。结果表明,在-7 V压降电压下,验证损耗最小,线性度最佳,电导比最佳,表明该忆阻器在神经形态计算中的潜在应用前景。
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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