Correlation between linear conductance variability and accuracy in neuromorphic computing using AuNP-DNA/HfO2 bilayer memristor devices

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY Measurement Pub Date : 2025-02-06 DOI:10.1016/j.measurement.2025.116960
Myoungsu Chae , Doowon Lee , Hyunbin Lee , Yuseong Jang , Taegi Kim , Youngeun Kim , Hee-Dong Kim
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Abstract

Memristor-based neuromorphic computing needs to improve energy efficiency using eco-friendly materials, but a single active layer with traditional materials still requires an improvement in reliability and performance. We propose a bilayers-memristor with gold nanoparticle (AuNP)-DNA for artificial synapse applications. As a result, the HfO2/AuNP-DNA-based memristor exhibits excellent linear weight update and large conductance ratio characteristics with high reliability and tunability. The high linearity of synaptic weights, achieved through simple programming according to pulse amplitude, can particularly enhance the device’s energy efficiency and learning accuracy in neural network applications. We assess the accuracy of the modified national institute of standards and technology simulations to compare the classification accuracy depending on linearity and the ratio of weight update. As a result, the smallest validation loss is observed at –7 V depression voltage, which has the best linearity and optimal conductance ratio, suggesting the potential application of the proposed memristor in neuromorphic computing.
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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