Piecewise system identification and trajectory acceleration reallocating for diamond turning of microlens arrays

Zhiyue Wang , Zhenhua Jiang , Hao Wu , Yangqin Yu , Limin Zhu , Xinquan Zhang
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Abstract

The use of microlens arrays (MLAs) manufactured through slow tool servo (STS) machining is becoming increasingly common in the field of complex surface optics. However, the current STS technique presents a significant challenge in balancing machining efficiency and surface profile accuracy, mainly due to the rapid variations in the spatial frequency of the microlenses. To address this challenge, this study proposes a piecewise system identification method along with trajectory acceleration reallocating. Specifically, the proposed method models the machine lathe Z-axis as a dynamic system piecewise, segmented by different trajectory acceleration intervals, to accurately approximate the nonlinear dynamic response of Z-axis. Tracking error prediction and trajectory acceleration reallocating are developed based on the piecewise system identification. To validate the proposed approach, diamond turning experiments were conducted on an ultraprecision machine lathe. The proposed approach significantly enhances the surface form accuracy while marginally improving the machining efficiency.
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微透镜阵列金刚石车削的分段系统辨识与轨迹加速度重分配
通过慢刀伺服(STS)加工制造的微透镜阵列(MLAs)在复杂表面光学领域的应用越来越普遍。然而,目前的STS技术在平衡加工效率和表面轮廓精度方面提出了重大挑战,主要是由于微透镜空间频率的快速变化。为了解决这一问题,本研究提出了一种分段系统识别和轨迹加速度再分配方法。具体而言,该方法将机床z轴作为一个动态系统分段建模,通过不同的轨迹加速度区间进行分割,以准确地逼近z轴的非线性动态响应。在分段辨识的基础上,提出了跟踪误差预测和轨迹加速度再分配方法。为了验证该方法,在超精密车床上进行了金刚石车削实验。该方法显著提高了表面形状精度,同时略微提高了加工效率。
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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