A selection method of key temperature points for thermal error modeling of machine tools featuring multiple heat sources

Lei Cao , Gyungho Khim , Seung Guk Baek , Sung-Chong Chung , Chun-Hong Park
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Abstract

A method that integrates grey relational and thermal sensitivity analyses, and fuzzy c-means clustering, called GTF method, is proposed to select key temperature points for thermal error modeling of machine tools featuring multiple heat sources. A two-dimensional temperature-error index is employed to prevent candidate temperature points with high correlations from being excluded when selecting the temperature points to improve thermal error compensation. To verify the method effectiveness and versatility, prediction accuracies were estimated for a vertical machining center and a floor-type boring machine with multiple heat sources. The root mean square error average reduction rates of the GTF method were approximately 28.0 % and 25.8 % in comparison with the conventional method for the two machine tools, respectively. From the results, it was confirmed that the proposed GTF method ensures accurate thermal predictions for machine tools with multiple heat sources, and is versatile.

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多热源机床热误差建模关键温度点的选择方法
提出了一种将灰色关联分析、热敏性分析和模糊c均值聚类相结合的GTF方法,用于多热源机床热误差建模的关键温度点选择。在选择温度点时,采用二维温度误差指数,防止相关性高的候选温度点被排除,提高热误差补偿能力。为了验证该方法的有效性和通用性,对具有多个热源的立式加工中心和落地式镗床的预测精度进行了估计。与传统方法相比,GTF方法对两种机床的均方根误差平均降低率分别约为28.0%和25.8%。结果表明,所提出的GTF方法能够保证多热源机床的准确热预测,并且具有通用性。
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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