Impact of La–Bi co-substitution on the structural, morphological, and dielectric properties of SrFe12O19: a comprehensive study

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2025-02-13 DOI:10.1007/s10854-025-14365-2
Ahmad Gholizadeh
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引用次数: 0

Abstract

This research investigates sol–gel auto-combustion synthesized Sr1-xLaxFe12-yBiyO19 (x = 0–0.25, y = 0–0.5) nanoparticles, focusing on La3+ and Bi3+ co-substitution effects on structural and dielectric properties. X-ray diffraction confirms a single-phase M-type hexagonal ferrite structure (space group P63/mmc) with crystallite sizes decreasing from 20 to 13 nm and lattice parameters increasing from 682.08 to 704.73 Å upon La3+ and Bi3+ co-substitution. Field-emission scanning electron microscopy analysis reveals that the La/Bi substitution results in changes to the morphology and particle size of the samples. Dielectric properties analyzed using impedance spectroscopy reveal a decreased real part of dielectric permittivity with increasing frequency and co-substitution, attributable to interfacial polarization and microstructural changes. The imaginary parts of the electrical modulus diagram exhibit a relaxation peak shift towards lower frequencies with co-substitution, indicating enhanced charge carrier mobility and Debye dielectric response. Findings offer comprehensive insights for tailoring properties in energy storage devices, electronic components, and related fields.

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La-Bi共取代对SrFe12O19结构、形态和介电性能影响的综合研究
本文研究溶胶-凝胶自燃烧合成Sr1-xLaxFe12-yBiyO19 (x = 0-0.25, y = 0-0.5)纳米粒子,重点研究La3+和Bi3+共取代对结构和介电性能的影响。x射线衍射证实了La3+和Bi3+共取代后的单相m型六方铁氧体结构(空间群P63/mmc),晶粒尺寸从20 nm减小到13 nm,晶格参数从682.08增加到704.73 Å。场发射扫描电镜分析表明,La/Bi取代导致样品的形貌和粒径发生变化。阻抗谱分析表明,由于界面极化和微观结构的变化,介质介电常数的实部随频率和共取代的增加而降低。电模量图的虚部表现出向低频方向的共取代弛豫峰位移,表明电荷载流子迁移率和德拜介电响应增强。研究结果为能源存储设备、电子元件和相关领域的定制特性提供了全面的见解。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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