Evaluation of thermal effects on natural organic honey memristive thin film for resistive switching memory applications

Abstract

Natural organic honey as a potential memristive material for resistive switching random access memory (ReRAM) was investigated by evaluating the thermal effects on physical and chemical properties, surface morphology and roughness, and memory and synaptic behaviors of the dried honey film. Surface tension and surface adhesion of honey solutions which are critical for forming the uniform dried film were characterized by Goniometer on different honey concentrations from 0 % to 50 % by weight. Fourier transform infrared spectroscopy, differential scanning calorimetry, optical microscope, atomic force microscopy, and scanning electron microscope were applied to characterize honey films formed after drying the honey solutions at different baking temperatures and durations. Ag/honey/ITO ReRAM devices were fabricated from the dried honey films, and their memory and synaptic behaviors including resistive switching cycle, endurance, retention, and neural facilitation were compared. This study established a useful practice in optimizing the processing particularly critical drying conditions to form honey memristive films for sustainable resistive switching memory devices.