Improved installation method for Skewed-Dual-Light-Probe (SDLP) in blade tip clearance measurement

IF 5.2 2区工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY Measurement Pub Date : 2025-02-25 DOI:10.1016/j.measurement.2025.117103

Xiaolei Guo, Huoxing Liu, Zhihong Zhou

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引用次数: 0

Abstract

Blade Tip Clearance (BTC) in aero-engine rotors is a critical parameter that directly impacts both performance and safety. Accurately acquiring dynamic BTC data remains a key focus in experimental testing. The Skewed-Dual-Light-Probe (SDLP) is a widely used sensor for measuring dynamic BTC. However, its measurement accuracy is often compromised by installation errors and casing deformation, which induce rotational misalignment around the sensor’s axis. This paper addresses this issue by analyzing the underlying mechanism of measurement error based on the sensor’s operating principles. We propose an improved installation method to mitigate these errors, which is validated through both theoretical analysis and experimental verification. Results show that, in theory, an optimal installation angle exists for the SDLP, which can reduce the measurement error caused by rotational misalignment. The proposed method reduces the sensor’s sensitivity to this misalignment, controlling its effect on clearance measurement to within 5 % for misalignment angles within ± 5°.

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来源期刊

Measurement 工程技术-工程：综合

CiteScore

10.20

自引率

12.50%

发文量

1589

审稿时长

12.1 months

期刊介绍： Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.