Parallel synthesis and physical properties of thickness graded LaCoO3

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2025-03-01 DOI:10.1007/s10854-025-14474-y
Bhargav Y. Pathak, Kuman Gagliya, Swati Pachauri, U. S. Joshi
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Abstract

Functional properties of oxide films largely depend upon its thickness. In conventional one-by-one thin film deposition approach, uniform deposition with single thickness is fabricated. Here, we have employed the concepts of combinatorial chemistry in pulsed laser deposition (C-PLD) system for the deposition of LaCoO3 compound. The combinatorial PLD allows one to obtain large variations of thickness onto one substrate in a single experiment. LaCoO3 is chosen to demonstrate the thickness dependent optical properties. Across 9 mm of substrate, more than 30 nm systematic thickness variations were achieved on a 10 mm quartz plate. Controlled mask motion with synchronised laser pulses were introduced to fabricate continuously varying film thickness across the substrate. Structural and surface properties were examined by X-ray diffraction, Raman spectroscopy and AFM respectively. Systematic variations in the electrical resistance and optical band gap were observed with film thickness. Using this unique approach, large number of samples with controlled variation in thickness can be fabricated in single experiment and can be optimized quickly for semiconductors which can be used for tuning the physical properties in RRAMs and solar cells.

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厚度梯度LaCoO3的平行合成及其物理性质
氧化膜的功能特性在很大程度上取决于其厚度。在传统的单层薄膜沉积方法中,制备的是单一厚度的均匀沉积。在这里,我们将组合化学的概念应用于脉冲激光沉积(C-PLD)系统中,用于沉积LaCoO3化合物。组合PLD允许在单个实验中在一个衬底上获得大的厚度变化。选择LaCoO3来演示与厚度相关的光学特性。在9毫米的衬底上,在10毫米的石英石板上实现了超过30纳米的系统厚度变化。采用同步激光脉冲控制掩模运动,在衬底上制造连续变化的薄膜厚度。用x射线衍射、拉曼光谱和原子力显微镜分别检测了材料的结构和表面性能。电阻和光带隙随薄膜厚度的变化有系统的变化。利用这种独特的方法,可以在一次实验中制造出大量厚度变化可控的样品,并可以快速优化半导体,用于调整rram和太阳能电池的物理性质。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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