S. V. Rogozhkin, A. V. Klauz, Yu. E. Gorshkova, G. D. Bokuchava, A. A. Khomich, A. A. Bogachev, A. A. Nikitin, A. G. Zaluzhny
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引用次数: 0
Abstract
A large number of oxide particles in dispersion-strengthened alloys and steels provides a significant increase in heat resistance to these materials. For detailed characterization of these nanostructed materials, multiple techniques are used such as transmission electron microscopy (TEM), atom probe tomography (APT), as well as small-angle X-ray and neutron scattering. Small-angle X-ray (SAXS) scattering is useful for analyzing comparatively large volumes of materials combined with an ability to detect phases from few to tens of nanometers in a single measurement. Thermal aging experiments can be used to determine the stability of oxides in dispersion-strengthened alloys and determine their usability in high heat applications. In this work, a stability of three different oxide dispersion-strengthened steels: Eurofer ODS, 10Cr ODS and KP-3 ODS (with different alloying systems) was studied using SAXS in the initial state and after thermal aging at 650°C up to 1000 h. To achieve most accurate results from SAXS analysis, a combination of TEM and APT was used to get proper parameters for correct data processing. The results of SAXS and TEM showed a good correlation in the oxides in the initial state of the steels. However, no cluster data was acquired from SAXS due to their relatively small contrast. According to SAXS results, there is no oxide dissolution present under thermal aging at 650°C up to 1000 h; meanwhile there is evidence of increase of number of oxides in KP-3 ODS due to the interaction between oxide and cluster subsystems.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.