Effect of Surface Treatment of Electron-Beam-Melted Ti–6Al–4V Alloy with a TiN Coating on Resistance to Hydrogenation

IF 0.5 Q4 PHYSICS, CONDENSED MATTER Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-01 DOI:10.1134/S1027451024701349

M. V. Khokhlov, D. V. Sidelev, E. B. Kashkarov, M. A. Kruglyakov

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Abstract

In this work, the effect of the type of mechanical treatment of the surface of titanium alloy Ti–6Al–4V obtained by electron-beam melting before the magnetron deposition of a titanium nitride (TiN) coating on its resistance to hydrogenation at a test temperature of 560°C and a hydrogen pressure of 2 atm is studied. Sandblasting and mechanical grinding/polishing of Ti–6Al–4V alloy are used as surface-preparation procedures for experimental samples. It is found that a TiN coating (with a thickness of 1 μm) obtained using reactive magnetron sputtering can reduce hydrogenation of the titanium alloy by 18 times compared to the uncoated alloy when preliminary grinding/polishing of the sample surface to a roughness (R_a) of 0.05 μm is applied. For samples of polished Ti–6Al–4V alloy with a coating, after hydrogenation tests, a decrease in the coating hardness from 20.8 to 10.9 GPa and a noticeable decrease in the critical load, at which delamination of the coating occurs (from 28.4 to 19.2 N), are observed. When applying a TiN coating to the titanium-alloy surface after sandblasting, the β phase of titanium is stabilized, and titanium hydride TiH₂ is formed during Ti–6Al–4V-alloy hydrogenation.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.