High reliability sinusoidal phase modulating interferometer combined reference signal and PGC-EFA-Arctan algorithm

IF 3.7 2区 工程技术 Q2 OPTICS Optics and Lasers in Engineering Pub Date : 2025-06-01 Epub Date: 2025-03-05 DOI:10.1016/j.optlaseng.2025.108930
Qiyuan Zhang , Lieshan Zhang , Wenjun Fang , Dunzhu Xia
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Abstract

The ellipse fitting algorithm (EFA) is commonly used in correction of the orthogonal interference signal pair for phase generated carrier (PGC) demodulation schemes to eliminate nonlinear errors. However, it often happens that the interference signal cannot form an effective Lissajous ellipse in some applications. In this paper, a highly reliable sinusoidal phase modulating interferometer (SPMI) combined a reference signal and PGC-EFA-Arctan (arctangent) algorithm is proposed. In this interferometer system, the reference signal is provided by a reference interferometer that shares the same modulation optical path with the measurement interferometer. The target detected by the reference interferometer is maintained at a vibration with appropriate amplitude and frequency, thereby ensuring a stable and accurate ellipse fitting result for the orthogonal signal pair correction of the measurement interferometer. The numerical simulation results have illustrated the theoretical effectiveness of the proposed SPMI in scenarios where the interference signal of the measurement interferometer is affected by significant light intensity disturbances (LID). The comparative experiments conducted on ellipse fitting results between the two interferometers have confirmed the feasibility of the proposed SPMI. Experiments under various conditions have validated the effectiveness of the proposed SPMI in enhancing the demodulation reliability, particularly with significant LID. Nano displacement measurement experiments indicate that the proposed SPMI offers better demodulation stability and accuracy with a deviation of less than 2 nm when Lissajous ellipse arc length of measurement signal is extremely short. The linearity of the proposed SPMI exceeds 99.99%, and the dynamic range reaches 95.69 dB @ 55 Hz, surpassing the 90.29 dB @ 55 Hz achieved by the typical SPMI that uses conventional PGC-EFA-Arctan demodulation scheme.
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结合参考信号和PGC-EFA-Arctan算法的高可靠性正弦相位调制干涉仪
椭圆拟合算法(EFA)通常用于相位产生载波(PGC)解调方案的正交干扰信号对校正,以消除非线性误差。然而,在某些应用中,经常会出现干扰信号不能形成有效利萨椭圆的情况。本文提出了一种结合参考信号和PGC-EFA-Arctan算法的高可靠正弦相位调制干涉仪(SPMI)。在该干涉仪系统中,参考信号由与测量干涉仪共享相同调制光路的参考干涉仪提供。将参考干涉仪检测到的目标保持在适当幅度和频率的振动状态,从而保证测量干涉仪正交信号对校正的椭圆拟合结果稳定准确。数值模拟结果表明,在测量干涉仪的干涉信号受到明显光强干扰(LID)影响的情况下,所提出的SPMI理论是有效的。对两种干涉仪的椭圆拟合结果进行了对比实验,验证了所提出的SPMI的可行性。各种条件下的实验验证了所提出的SPMI在提高解调可靠性方面的有效性,特别是在明显的LID下。纳米位移测量实验表明,当测量信号的Lissajous椭圆弧长极短时,所提出的SPMI具有较好的解调稳定性和精度,解调误差小于2 nm。所提出的SPMI线性度超过99.99%,动态范围达到95.69 dB @ 55 Hz,超过了使用传统PGC-EFA-Arctan解调方案的典型SPMI所达到的90.29 dB @ 55 Hz。
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来源期刊
Optics and Lasers in Engineering
Optics and Lasers in Engineering 工程技术-光学
CiteScore
8.90
自引率
8.70%
发文量
384
审稿时长
42 days
期刊介绍: Optics and Lasers in Engineering aims at providing an international forum for the interchange of information on the development of optical techniques and laser technology in engineering. Emphasis is placed on contributions targeted at the practical use of methods and devices, the development and enhancement of solutions and new theoretical concepts for experimental methods. Optics and Lasers in Engineering reflects the main areas in which optical methods are being used and developed for an engineering environment. Manuscripts should offer clear evidence of novelty and significance. Papers focusing on parameter optimization or computational issues are not suitable. Similarly, papers focussed on an application rather than the optical method fall outside the journal''s scope. The scope of the journal is defined to include the following: -Optical Metrology- Optical Methods for 3D visualization and virtual engineering- Optical Techniques for Microsystems- Imaging, Microscopy and Adaptive Optics- Computational Imaging- Laser methods in manufacturing- Integrated optical and photonic sensors- Optics and Photonics in Life Science- Hyperspectral and spectroscopic methods- Infrared and Terahertz techniques
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