Thermoelectric properties of ZnO:Al as a function of temperature

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2025-03-10 DOI:10.1007/s10854-025-14493-9
Asghari Maqsood, Aamir Mahmood, Bushra Waheed, Fiaz Ahmad
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引用次数: 0

Abstract

The ZnO (99%) and Al (1%) powders were combined in a manual pellet press to form the ZnO:Al pellets, which were subsequently annealed in an oxygen atmosphere at temperatures ranging from 600 °C to 900 °C. X-ray diffraction data indicated improved crystallinity up to an annealing temperature of 700 °C because of the compensation of donor defects caused by oxygen vacancies. The quality of the crystal decreased because of further annealing, which caused oxygen atoms to diffuse into interstitial sites. The Seebeck measurements showed an increase in the values up to the annealing temperature of 700 °C, with a decrease at higher temperatures. The electrical conductivity showed a decreasing trend up to 700 °C, followed by an increase with further annealing. The observed behavior of the Seebeck coefficient and electrical conductivity with annealing temperature suggests enhanced carrier concentration and mobility. The significant improvement in thermoelectric properties can be attributed to the enhanced mobility of charge carriers.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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