{"title":"Study on the stability and reliability performance of piezoelectric ceramics under vibration load","authors":"Guan Duan, Yingwei Li, Chi Tan","doi":"10.1007/s10854-025-14429-3","DOIUrl":null,"url":null,"abstract":"<div><p>Piezoelectric energy harvester (PEH) needs to be in service for a long period under vibration loads of different frequencies, and the piezoelectric and dielectric parameters of piezoelectric materials will fluctuate during vibration. In this study, an experimental setup was designed for testing the change of piezoelectric coefficient <span>\\({d}_{33}\\)</span> and relative permittivity <span>\\({\\varepsilon }_{r}\\)</span> before and after the vibration of piezoelectric materials under different frequencies (10 Hz, 100 Hz, 1000 Hz). Three common lead zirconate titanate (PZT) materials (PZT-4, PZT-5H, PZT-8) were selected for testing. The results showed that the piezoelectric coefficient <span>\\({d}_{33}\\)</span> and relative permittivity <span>\\({\\varepsilon }_{r}\\)</span> of the three types of PZT materials fluctuated at three different moments (before the vibration, after the vibration, and 24 h after the vibration), but PZT-5H was more obvious than the other two. Furthermore, we designed an experimental setup to observe the crack propagation of three types of piezoelectric materials before and after vibration. The results showed that the crack propagation is about 1–5 <span>\\(\\mu m\\)</span> at 1000 Hz vibration frequency, while it is not obvious at the other two frequencies (10 Hz, 100 Hz). The above experimental results provide references for the design of piezoelectric devices.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 8","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-14429-3","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Piezoelectric energy harvester (PEH) needs to be in service for a long period under vibration loads of different frequencies, and the piezoelectric and dielectric parameters of piezoelectric materials will fluctuate during vibration. In this study, an experimental setup was designed for testing the change of piezoelectric coefficient \({d}_{33}\) and relative permittivity \({\varepsilon }_{r}\) before and after the vibration of piezoelectric materials under different frequencies (10 Hz, 100 Hz, 1000 Hz). Three common lead zirconate titanate (PZT) materials (PZT-4, PZT-5H, PZT-8) were selected for testing. The results showed that the piezoelectric coefficient \({d}_{33}\) and relative permittivity \({\varepsilon }_{r}\) of the three types of PZT materials fluctuated at three different moments (before the vibration, after the vibration, and 24 h after the vibration), but PZT-5H was more obvious than the other two. Furthermore, we designed an experimental setup to observe the crack propagation of three types of piezoelectric materials before and after vibration. The results showed that the crack propagation is about 1–5 \(\mu m\) at 1000 Hz vibration frequency, while it is not obvious at the other two frequencies (10 Hz, 100 Hz). The above experimental results provide references for the design of piezoelectric devices.
期刊介绍:
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.