{"title":"Evaluation of the stiffness isotropy for spatially isotropic Stewart platforms","authors":"Xinbing Ding","doi":"10.1016/j.precisioneng.2025.03.005","DOIUrl":null,"url":null,"abstract":"<div><div>It is known that a six-degree-of-freedom (DOF) Stewart platform that has been designed to be spatially isotropic in the central configuration cannot be spatially isotropic in any other configuration. Hence, in order to evaluate the practical usefulness of the mechanism, it is necessary to evaluate the stiffness isotropy around the spatially isotropic configuration in the workspace. One of the most popular methods for assessing the stiffness isotropy is based on the condition number, because parallel robots are spatially isotropic when the condition number of the Cartesian stiffness matrix of the robot is equal to one. However, the methods based on the condition number have several drawbacks, such as the fact that the effect of the middle eigenvalues or middle singular values is not considered. This paper first introduces the calculation steps of the Cartesian stiffness matrix for each configuration of the workspace. Thereafter, three novel methods for evaluating the stiffness isotropy of the Cartesian stiffness matrix in non-spatially isotropic configurations are introduced. Finally, two spatially isotropic variants are selected to verify these three methods.</div></div>","PeriodicalId":54589,"journal":{"name":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","volume":"94 ","pages":"Pages 303-314"},"PeriodicalIF":3.5000,"publicationDate":"2025-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0141635925000789","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}
引用次数: 0
Abstract
It is known that a six-degree-of-freedom (DOF) Stewart platform that has been designed to be spatially isotropic in the central configuration cannot be spatially isotropic in any other configuration. Hence, in order to evaluate the practical usefulness of the mechanism, it is necessary to evaluate the stiffness isotropy around the spatially isotropic configuration in the workspace. One of the most popular methods for assessing the stiffness isotropy is based on the condition number, because parallel robots are spatially isotropic when the condition number of the Cartesian stiffness matrix of the robot is equal to one. However, the methods based on the condition number have several drawbacks, such as the fact that the effect of the middle eigenvalues or middle singular values is not considered. This paper first introduces the calculation steps of the Cartesian stiffness matrix for each configuration of the workspace. Thereafter, three novel methods for evaluating the stiffness isotropy of the Cartesian stiffness matrix in non-spatially isotropic configurations are introduced. Finally, two spatially isotropic variants are selected to verify these three methods.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.