A data-assisted physics-informed neural network for predicting fatigue life of electronic components under complex shock loads

IF 6.8 2区 材料科学 Q1 ENGINEERING, MECHANICAL International Journal of Fatigue Pub Date : 2025-08-01 Epub Date: 2025-03-13 DOI:10.1016/j.ijfatigue.2025.108933
Shuai Ma , Yongbin Dang , Yi Sun , Zhiqiang Yang
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Abstract

Reusable spacecraft electronic components experience multiple, complex shock damage during their operational life, which is a primary contributor to mission failure. This study proposes a data-assisted physics-informed neural network (DA-PINN) model to assess fatigue damage in electronic components under complex shock loads. Unlike traditional PINN that solves partial differential equations, DA-PINN combines experimental with physics equations to enhance prediction accuracy. An autoregressive (AR) model was used to improve the shock fatigue life model, which was then integrated as a physical constraint into the loss function of DA-PINN. Subsequently, using ball grid array (BGA) solder joints as the research subject, complex shock fatigue experiments were conducted to train and validate the DA-PINN model. The results demonstrate the outstanding performance of the DA-PINN model, with all predicted shock fatigue life values falling within a scatter band of 1.5 times, surpassing the traditional shock fatigue life model and artificial neural networks. Notably, the physics-informed constraints embedded in DA-PINN enable it to maintain strong prediction accuracy and stability even when trained on small datasets. The proposed model can provide a reference for predicting the shock fatigue life of electronic components in reusable spacecraft.
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在复杂冲击载荷下预测电子元件疲劳寿命的数据辅助物理信息神经网络
可重复使用的航天器电子元件在其使用寿命期间会经历多次复杂的冲击损伤,这是导致任务失败的主要原因。本研究提出了一种数据辅助物理信息神经网络(DA-PINN)模型来评估复杂冲击载荷下电子元件的疲劳损伤。与传统的求解偏微分方程的PINN不同,DA-PINN将实验方程与物理方程相结合,提高了预测精度。采用自回归(AR)模型对冲击疲劳寿命模型进行改进,并将其作为物理约束集成到DA-PINN的损失函数中。随后,以球栅阵列(BGA)焊点为研究对象,进行了复杂冲击疲劳实验,对DA-PINN模型进行了训练和验证。结果表明,DA-PINN模型具有优异的性能,预测的冲击疲劳寿命值均落在1.5倍的散射带内,优于传统的冲击疲劳寿命模型和人工神经网络。值得注意的是,DA-PINN中嵌入的物理信息约束使其即使在小数据集上训练时也能保持很强的预测准确性和稳定性。该模型可为可重复使用航天器电子元件冲击疲劳寿命预测提供参考。
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来源期刊
International Journal of Fatigue
International Journal of Fatigue 工程技术-材料科学:综合
CiteScore
10.70
自引率
21.70%
发文量
619
审稿时长
58 days
期刊介绍: Typical subjects discussed in International Journal of Fatigue address: Novel fatigue testing and characterization methods (new kinds of fatigue tests, critical evaluation of existing methods, in situ measurement of fatigue degradation, non-contact field measurements) Multiaxial fatigue and complex loading effects of materials and structures, exploring state-of-the-art concepts in degradation under cyclic loading Fatigue in the very high cycle regime, including failure mode transitions from surface to subsurface, effects of surface treatment, processing, and loading conditions Modeling (including degradation processes and related driving forces, multiscale/multi-resolution methods, computational hierarchical and concurrent methods for coupled component and material responses, novel methods for notch root analysis, fracture mechanics, damage mechanics, crack growth kinetics, life prediction and durability, and prediction of stochastic fatigue behavior reflecting microstructure and service conditions) Models for early stages of fatigue crack formation and growth that explicitly consider microstructure and relevant materials science aspects Understanding the influence or manufacturing and processing route on fatigue degradation, and embedding this understanding in more predictive schemes for mitigation and design against fatigue Prognosis and damage state awareness (including sensors, monitoring, methodology, interactive control, accelerated methods, data interpretation) Applications of technologies associated with fatigue and their implications for structural integrity and reliability. This includes issues related to design, operation and maintenance, i.e., life cycle engineering Smart materials and structures that can sense and mitigate fatigue degradation Fatigue of devices and structures at small scales, including effects of process route and surfaces/interfaces.
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