A microrod-based photoconductivity enhancement in copper antimony selenide PIN photodetector

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Materials Science: Materials in Electronics Pub Date : 2025-04-21 DOI:10.1007/s10854-025-14772-5
M. Irshad Ahamed, M. Suganthi Priya, Salahaldeen Duraibi, Saahira Banu Ahamed
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Abstract

A P-type semiconductor namely CuSbSe2 developed in the recent times has acquired a lot of attention because of its low cost promising optoelectronic features and widely abundant precursor elements. This study explores CuSbSe2 photodetector based on a microrod designed with the help of simple separation approach from crystals which have 150–300 μm thickness. In comparison to thin film-based device (D1), microrod-based device (D2) performs more efficiently as it is more responsive and operates in a self-bias manner. D2 displayed an enhanced responsivity with a value of 0.27 A/W with 31% of EQE (External Quantum Efficiency) at 1064 nm wavelength and 15 mW/cm2 power density. Moreover 532 nm, 0.038 A/W responsivity with 9% EQE was achieved by D2 under 32 mW/cm2. The time taken by D2 to respond or recover at 1064 nm was 68.7 and 35.1 ms and at 532 nm was 15.7 and 41.2 ms. This operation is self-powered and is implemented at 0.02 V which is a lower value of bias. The findings of this research will be reveal that microrods of CuSbSe2 offer significantly enhanced performance and responds at a faster pace with higher sensitivity. The above properties find them apt for low cost, self-powered optoelectronic applications.

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硒化铜锑PIN光电探测器中基于微棒的光导增强
近年来开发的p型半导体CuSbSe2以其低成本的光电子特性和广泛丰富的前驱体元素而受到广泛关注。本研究探索了基于微棒的CuSbSe2光电探测器,利用简单的分离方法设计了厚度为150-300 μm的晶体。与基于薄膜的器件(D1)相比,基于微棒的器件(D2)具有更高的效率,因为它具有更高的响应性和自偏置工作方式。在1064 nm波长和15 mW/cm2功率密度下,D2的响应率为0.27 a /W,外部量子效率(EQE)为31%。在32 mW/cm2下,D2可获得532 nm 0.038 A/W的响应率和9%的EQE。D2在1064 nm和532 nm的反应和恢复时间分别为68.7和35.1 ms和15.7和41.2 ms。该操作是自供电的,并在0.02 V下实现,这是一个较低的偏置值。本研究结果将揭示CuSbSe2微棒具有显著增强的性能,响应速度更快,灵敏度更高。上述特性使它们适合低成本、自供电的光电应用。
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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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