{"title":"Linking the Results of CIPM and RMO Key Comparisons With Linear Trends.","authors":"Nien Fan Zhang","doi":"10.6028/jres.115.010","DOIUrl":null,"url":null,"abstract":"<p><p>A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparison artifacts have the same nominal values or the measured quantities have the same magnitudes. The degrees of equivalence between the pairs of National Metrology Institutes that have not participated in the same comparisons, and their corresponding uncertainties are established. The approach is applied to link the CCEM-K2 and SIM.EM-K2 comparisons for resistance at 1 G Ω level.</p>","PeriodicalId":17039,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5000,"publicationDate":"2010-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4548531/pdf/","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Institute of Standards and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.6028/jres.115.010","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2010/5/1 0:00:00","PubModel":"Print","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A statistical approach to link the results of interlaboratory comparisons with linear trends is proposed. This approach can be applied to the case that the comparison artifacts have the same nominal values or the measured quantities have the same magnitudes. The degrees of equivalence between the pairs of National Metrology Institutes that have not participated in the same comparisons, and their corresponding uncertainties are established. The approach is applied to link the CCEM-K2 and SIM.EM-K2 comparisons for resistance at 1 G Ω level.
期刊介绍：
The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards.
In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research.
The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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