First-Principles Calculation of the Third Virial Coefficient of Helium.

IF 1.5 4区 工程技术 Journal of Research of the National Institute of Standards and Technology Pub Date : 2009-10-01 Print Date: 2009-09-01 DOI:10.6028/jres.114.018
Giovanni Garberoglio, Allan H Harvey
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Abstract

Knowledge of the pair and three-body potential-energy surfaces of helium is now sufficient to allow calculation of the third density virial coefficient, C(T), with significantly smaller uncertainty than that of existing experimental data. In this work, we employ the best available pair and three-body potentials for helium and calculate C(T) with path-integral Monte Carlo (PIMC) calculations supplemented by semiclassical calculations. The values of C(T) presented extend from 24.5561 K to 10 000 K. In the important metrological range of temperatures near 273.16 K, our uncertainties are smaller than the best experimental results by approximately an order of magnitude, and the reduction in uncertainty at other temperatures is at least as great. For convenience in calculation of C(T) and its derivatives, a simple correlating equation is presented.

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氦气第三室温系数的第一原理计算。
现在对氦的对体和三体势能面的了解已经足以计算第三密度维里系数 C(T),其不确定性大大小于现有的实验数据。在这项工作中,我们采用了现有最好的氦对和三体势能,并通过路径积分蒙特卡罗(PIMC)计算,辅以半经典计算,计算出了 C(T)。在靠近 273.16 K 的重要计量温度范围内,我们的不确定性比最佳实验结果小大约一个数量级,而在其他温度下,不确定性的减小至少同样大。为了方便计算 C(T) 及其导数,我们给出了一个简单的相关方程。
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33.30%
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10
期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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