Automated acquisition of vast numbers of electron holograms with atomic-scale phase information

IF 1.8 4区 工程技术 Microscopy Pub Date : 2019-11-01 DOI:10.1093/jmicro/dfaa004
Yoshio Takahashi;Tetsuya Akashi;Atsuko Sato;Toshiaki Tanigaki;Hiroyuki Shinada;Yasukazu Murakami
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引用次数: 7

Abstract

An automated acquisition system for collecting a large number of electron holograms, to improve the statistical precision of phase analysis, was developed. A technique for shifting the electron beam in combination with stage movement allows data to be acquired over a wide area of a TEM-specimen grid. Undesired drift in the hologram position, which may occur during the hologram acquisition, can be corrected in real time by automated detection of the interference-fringe region in an image. To demonstrate the usefulness of the developed automated hologram acquisition system, gold nanoparticles dispersed on a carbon foil were observed with a 1.2-MV atomic resolution holography electron microscope. The system could obtain 1024 holograms, which provided phase maps for more than 500 nanoparticles with a lateral resolution of 0.14 nm, in just 1 h. The observation results revealed an anomalous increase in mean inner potential for a particle size smaller than 4 nm. The developed automated hologram acquisition system can be applied to improve the precision of phase measurement by averaging many phase images, as demonstrated by single particle analysis for biological entities. Moreover, the system makes it possible to study electrostatic potential of catalysts and other functional nanoparticles at atomic resolution.
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利用原子尺度相位信息自动获取大量电子全息图
为了提高相位分析的统计精度,开发了一种用于收集大量电子全息图的自动采集系统。结合载物台移动来移动电子束的技术允许在TEM样品网格的宽区域上获取数据。可以通过图像中干涉条纹区域的自动检测来实时校正在全息图获取期间可能发生的全息图位置中的不希望的漂移。为了证明所开发的自动全息图采集系统的有用性,用1.2-MV原子分辨率的全息电子显微镜观察了分散在碳箔上的金纳米颗粒。该系统可以在短短1小时内获得1024张全息图,为500多个横向分辨率为0.14 nm的纳米颗粒提供相位图。观察结果显示,对于小于4 nm的颗粒尺寸,平均内电势异常增加。如生物实体的单粒子分析所示,所开发的自动全息图采集系统可以通过对许多相位图像进行平均来提高相位测量的精度。此外,该系统使以原子分辨率研究催化剂和其他功能纳米颗粒的静电势成为可能。
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来源期刊
Microscopy
Microscopy 工程技术-显微镜技术
自引率
11.10%
发文量
0
审稿时长
>12 weeks
期刊介绍: Microscopy, previously Journal of Electron Microscopy, promotes research combined with any type of microscopy techniques, applied in life and material sciences. Microscopy is the official journal of the Japanese Society of Microscopy.
期刊最新文献
In This Issue Scanning ion-conductance microscopy with a double-barreled nanopipette for topographic imaging of charged chromosomes Operando observation of magnetism in HDD writing heads by spin-polarized scanning electron microscopy Deep convolutional neural network image processing method providing improved signal-to-noise ratios in electron holography Electron transfer in LiMn1.5Ni0.5O4 during charging studied with soft X-ray spectrometry
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